Piva, F.
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3

Bias-dependent degradation of single quantum well on InGaN-..:

Casu, C. ; Buffolo, M. ; Caria, A....
Microelectronics Reliability.  150 (2023)  - p. 115132 , 2023
 
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5

Degradation mechanisms of InGaN visible LEDs and AlGaN UV L..:

, In: Reliability of Semiconductor Lasers and Optoelectronic Devices,
De Santi, C. ; Caria, A. ; Piva, F.... - p. 273-312 , 2021
 
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6

List of contributors:

, In: Reliability of Semiconductor Lasers and Optoelectronic Devices,
Bowers, John E. ; Caria, A. ; De Santi, C.... - p. xi , 2021
 
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7

Review on the degradation of GaN-based lateral power transi..:

De Santi, C. ; Buffolo, M. ; Rossetto, I....
e-Prime - Advances in Electrical Engineering, Electronics and Energy.  1 (2021)  - p. 100018 , 2021
 
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8

Antiproliferative effect of mifepristone (RU486) on human n..:

Casulari, L.A. ; Dondi, D. ; Pratesi, G....
Brazilian Journal of Medical and Biological Research.  53 (2020)  11 - p. , 2020
 
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9

Degradation mechanisms in high power InGaN semiconductor la..:

Piva, F. ; De Santi, C. ; Buffolo, M....
Microelectronics Reliability.  114 (2020)  - p. 113786 , 2020
 
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11

Defect incorporation in In-containing layers and quantum we..:

Piva, F ; De Santi, C ; Caria, A...
Journal of Physics D: Applied Physics.  54 (2020)  2 - p. 025108 , 2020
 
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12

Stability and degradation of AlGaN-based UV-B LEDs: Role of..:

Piva, F. ; De Santi, C. ; Deki, M....
Microelectronics Reliability.  100-101 (2019)  - p. 113418 , 2019
 
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