E-LIB Suche - Ergebnisse für: Polignano, M.

1

85P Real-world molecular profiling in gynaecologic oncology..:

Mantiero, M. ; Polignano, M. ; Bini, M....
ESMO Open. 9 (2024) - p. 103545 , 2024

Link: https://doi.org/10.1016/..

2

Analysis of the dark current distribution of complementary ..:

Polignano, M L ; Russo, F ; Moccia, G.
Semiconductor Science and Technology. 35 (2020) 12 - p. 124003 , 2020

Link: https://doi.org/10.1088/..

3

Review of applications of Defect Photoluminescence Imaging ..:

, In: 2019 19th International Workshop on Junction Technology (IWJT),

Jastrzebski, L. ; Roffarello ; Nadudvari, G.... - p. 1-6 , 2019

Link: https://doi.org/10.23919..

4

Point and extended defect interaction in low – high energy ..:

Mica, I. ; Polignano, M.L. ; Bacciaglia, P....
Materials Today: Proceedings. 5 (2018) 6 - p. 14778-14784 , 2018

Link: https://doi.org/10.1016/..

5

Analysis of Near-Surface Metal Contamination by Photolumine..:

Polignano, M. L. ; Galbiati, A. ; Mica, I....
ECS Journal of Solid State Science and Technology. 7 (2018) 3 - p. R12-R16 , 2018

Link: https://doi.org/10.1149/..

6

Comparison of techniques for detecting metal contamination ..:

Polignano, M.L. ; Borionetti, G. ; Galbiati, A....
Spectrochimica Acta Part B: Atomic Spectroscopy. 149 (2018) - p. 313-321 , 2018

Link: https://doi.org/10.1016/..

7

Hafnium Impurity Defects in Silicon: A Characterization:

Mica, I. ; Frascaroli, J. ; Vangelista, S....
ECS Journal of Solid State Science and Technology. 7 (2018) 10 - p. P583-P587 , 2018

Link: https://doi.org/10.1149/..

8

Molybdenum and Tungsten Contamination in MOS Capacitors:

Polignano, M. L. ; Galbiati, A. ; Grasso, S...
ECS Journal of Solid State Science and Technology. 5 (2016) 5 - p. P203-P210 , 2016

Link: https://doi.org/10.1149/..

9

Tungsten contamination in ion implantation:

Polignano, M.L. ; Barbarossa, F. ; Galbiati, A...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 377 (2016) - p. 99-104 , 2016

Link: https://doi.org/10.1016/..

10

Contamination by slow diffusers in ion implantation process..:

Polignano, M.L. ; Mica, I. ; Barbarossa, F....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 356-357 (2015) - p. 164-171 , 2015

Link: https://doi.org/10.1016/..

11

A comparative analysis of different measurement techniques ..:

Polignano, M. L. ; Codegoni, D. ; Grasso, S....
physica status solidi (a). 212 (2015) 3 - p. 495-505 , 2015

Link: https://doi.org/10.1002/..

12

Palladium contamination in silicon:

Polignano, M.L. ; Mica, I. ; Ceresoli, M....
Solid-State Electronics. 106 (2015) - p. 68-77 , 2015

Link: https://doi.org/10.1016/..

13

Review—Characterization of Metal-Contamination Effects in S..:

Polignano, M. L. ; Codegoni, D. ; Galbiati, A....
ECS Journal of Solid State Science and Technology. 5 (2015) 4 - p. P3048-P3058 , 2015

Link: https://doi.org/10.1149/..

14

Proximity gettering of slow diffuser contaminants in CMOS i..:

Russo, F. ; Moccia, G. ; Nardone, G....
Solid-State Electronics. 91 (2014) - p. 91-99 , 2014

Link: https://doi.org/10.1016/..

15

Optimization of laser anneal conditions for implanted shall..:

Soncini, V. ; Mica, I. ; Grasso, S....
Microelectronic Engineering. 125 (2014) - p. 51-57 , 2014

Link: https://doi.org/10.1016/..