E-LIB Suche - Ergebnisse für: Pollakowski, B.

1

Approaches to calculate the dielectric function of ZnO arou..:

Agocs, E. ; Fodor, B. ; Pollakowski, B....
Thin Solid Films. 571 (2014) - p. 684-688 , 2014

Link: https://doi.org/10.1016/..

2

Grazing-incidence x-ray fluorescence analysis for non-destr..:

Streeck, C. ; Brunken, S. ; Gerlach, M....
Applied Physics Letters. 103 (2013) 11 - p. , 2013

Link: https://doi.org/10.1063/..

3

Characterization of ZnO structures by optical and X-ray met..:

Petrik, P. ; Pollakowski, B. ; Zakel, S....
Applied Surface Science. 281 (2013) - p. 123-128 , 2013

Link: https://doi.org/10.1016/..

4

A novel instrument for quantitative nanoanalytics involving..:

Lubeck, J. ; Beckhoff, B. ; Fliegauf, R....
Review of Scientific Instruments. 84 (2013) 4 - p. , 2013

Link: https://doi.org/10.1063/..

5

Focusing of soft X-ray radiation and characterization of th..:

Unterumsberger, R. ; Müller, M. ; Beckhoff, B....
Spectrochimica Acta Part B: Atomic Spectroscopy. 78 (2012) - p. 37-41 , 2012

Link: https://doi.org/10.1016/..

6

Chemical interactions in the layered system BC x N y /Ni(Cu..:

Hoffmann, P. S. ; Kosinova, M. I. ; Flege, S....
Analytical and Bioanalytical Chemistry. 404 (2012) 2 - p. 479-487 , 2012

Link: https://doi.org/10.1007/..

7

Silicon carbonitride nanolayers — Synthesis and chemical ch..:

Hoffmann, P.S. ; Fainer, N.I. ; Baake, O....
Thin Solid Films. 520 (2012) 18 - p. 5906-5913 , 2012

Link: https://doi.org/10.1016/..

8

F-61 Depth-Resolved Speciation of Buried Nanolayers:

Pollakowski, B. ; Beckhoff, B.
Powder Diffraction. 25 (2010) 2 - p. 215-215 , 2010

Link: https://doi.org/10.1154/..

9

GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A ..:

Pagels, M. ; Reinhardt, F. ; Pollakowski, B....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 268 (2010) 3-4 - p. 370-373 , 2010

Link: https://doi.org/10.1016/..

10

F-62 Characterization of Nanoparticles with X-ray Spectrome..:

Reinhardt, F. ; Beckhoff, B. ; Pollakowski, B...
Powder Diffraction. 25 (2010) 2 - p. 221-221 , 2010

Link: https://doi.org/10.1154/..

11

Chemical characterization of SiCxNy nanolayers by FTIR-and ..:

Baake, O. ; Fainer, N.I. ; Hoffmann, P....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 603 (2009) 1-2 - p. 174-177 , 2009

Link: https://doi.org/10.1016/..

12

Evaluation of High-Resolution X-ray Absorption and Emission..:

Reinhardt, F. ; Beckhoff, B. ; Eba, H....
Analytical Chemistry. 81 (2009) 5 - p. 1770-1776 , 2009

Link: https://doi.org/10.1021/..

13

Chemical character of BCxNy layers grown by CVD with trimet..:

Baake, O. ; Hoffmann, P. S. ; Klein, A....
X-Ray Spectrometry. 38 (2008) 1 - p. 68-73 , 2008

Link: https://doi.org/10.1002/..

14

Chemical bonding in carbonitride nanolayers:

Hoffmann, P. ; Baake, O. ; Beckhoff, B....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 575 (2007) 1-2 - p. 78-84 , 2007

Link: https://doi.org/10.1016/..

15

Scaling test of fermion actions in the Schwinger model:

Christian, N. ; Jansen, K. ; Nagai, K..
Nuclear Physics B. 739 (2006) 1-2 - p. 60-84 , 2006

Link: https://doi.org/10.1016/..