Gericke, F ;
Segnon, M ;
von Helversen, M.M...
Gericke , F , Segnon , M , von Helversen , M M , Hopfmann , M , Heindel , T , Schneider , C , Höfling , S , Kamp , M , Musiał , A , Porte , X , Gies , C & Reitzenstein , S 2018 , ' Controlling the gain contribution of background emitters in few-quantum-dot microlasers ' , New Journal of Physics , vol. 20 , 023036 . https://doi.org/10.1088/1367-2630/aaa477.
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2018