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Porti, Marc
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1

On the Aging of OTFTs and Its Impact on PUFs Reliability:

Porti, Marc ; Palau, Gerard ; Crespo-Yepes, Albert...
Micromachines.  15 (2024)  4 - p. 443 , 2024
Link: https://doi.org/10.3390/..
 
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2

Oxide Breakdown Spot Spatial Patterns as Fingerprints for O..:

Porti, Marc ; Redón, Miquel ; Muñoz, Jordi..
IEEE Electron Device Letters.  44 (2023)  10 - p. 1600-1603 , 2023
Link: https://doi.org/10.1109/..
 
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3

A Smart Measurement System for the Combined Nanoscale and D..:

Claramunt, Sergi ; Arrese, Javier ; Ruiz, Ana...
IEEE Transactions on Nanotechnology.  22 (2023)  - p. 28-35 , 2023
Link: https://doi.org/10.1109/..
 
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4

Low-Power, High-Performance, Non-volatile Inkjet-Printed Hf..:

Vescio, Giovanni ; Martín, Gemma ; Crespo-Yepes, Albert...
ACS Applied Materials & Interfaces.  11 (2019)  26 - p. 23659-23666 , 2019
Link: https://doi.org/10.1021/..
 
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5

(Invited) Advanced Measurement Techniques for the Character..:

Nafria, Montserrat ; Rodriguez, Rosana ; Porti, Marc...
ECS Transactions.  79 (2017)  1 - p. 139-148 , 2017
Link: https://doi.org/10.1149/..
 
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6

In Situ Demonstration of the Link Between Mechanical Streng..:

Shi, Yuanyuan ; Ji, Yanfeng ; Hui, Fei...
Advanced Electronic Materials.  1 (2015)  4 - p. , 2015
Link: https://doi.org/10.1002/..
 
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7

(Invited) Elucidating the Origin of Resistive Switching in ..:

Shi, Yuanyuan ; Ji, Yanfeng ; Hui, Fei...
ECS Transactions.  64 (2014)  14 - p. 19-28 , 2014
Link: https://doi.org/10.1149/..
 
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8

Analysis of Factors in the Nanoscale Physical and Electrica..:

Zhang, Kai ; Lanza, Mario ; Shen, Ziyong...
Integrated Ferroelectrics.  153 (2014)  1 - p. 1-8 , 2014
Link: https://doi.org/10.1080/..
 
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9

Editorial Article for the Journal of Microscopy Research:

Porti, Marc
Microscopy Research.  1 (2013)  2 - p. 7-7 , 2013
Link: https://doi.org/10.4236/..
 
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10

Nanoscale and device level electrical behavior of annealed ..:

Bayerl, Albin ; Lanza, Mario ; Aguilera, Lidia...
Microelectronics Reliability.  53 (2013)  6 - p. 867-871 , 2013
Link: https://doi.org/10.1016/..
 
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11

Leakage current through the poly-crystalline HfO2: Trap den..:

Pirrotta, Onofrio ; Larcher, Luca ; Lanza, Mario...
Journal of Applied Physics.  114 (2013)  13 - p. , 2013
Link: https://doi.org/10.1063/..
 
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12

Electrical and mechanical performance of graphene sheets ex..:

Lanza, Mario ; Wang, Yan ; Gao, Teng...
Nano Research.  6 (2013)  7 - p. 485-495 , 2013
Link: https://doi.org/10.1007/..
 
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13

Polycrystallization effects on the nanoscale electrical pro..:

Lanza, Mario ; Iglesias, Vanessa ; Porti, Marc..
Nanoscale Research Letters.  6 (2011)  1 - p. , 2011
Link: https://doi.org/10.1186/..
 
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14

(Invited) Dielectric Breakdown in Ultra-Thin Hf Based Gate ..:

Rodriguez, Rosana ; Martin-Martinez, Javier ; Crespo-Yepes, Albert...
ECS Transactions.  41 (2011)  3 - p. 373-388 , 2011
Link: https://doi.org/10.1149/..
 
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15

(Invited) Variability and Reliability in Ultra-Scaled MOS D..:

Nafría, Montserrat ; Rodríguez, Rosana ; Porti, Marc...
ECS Transactions.  28 (2010)  2 - p. 225-236 , 2010
Link: https://doi.org/10.1149/..
 
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