Jencic, Bastjan ;
Sepec, Luka ;
Vavpetic, Primoz...
Jencic , B , Sepec , L , Vavpetic , P , Kelemen , M , Rupnik , Z , Vencelj , M , Vogel-Mikus , K , Potocnik , N O , Ellis , S R , Heeren , R & Pelicon , P 2019 , ' Stigmatic imaging of secondary ions in MeV-SIMS spectrometry by linear Time-of-Flight mass spectrometer and the TimePix detector ' , Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms , vol. 452 , pp. 1-6 . https://doi.org/10.1016/j.nimb.2019.05.040.
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2019