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Prosolovich, A. V.
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1

ELECTRON IRRADIATED PI2610 POLYIMIDE FILMS ON MONOCRYSTALLI..:

VABISHCHEVICH, S. ; VABISHCHEVICH, N. ; BRINKEVICH, D....
HERALD OF POLOTSK STATE UNIVERSITY. Series С FUNDAMENTAL SCIENCES.  , 2024
Link: https://doi.org/10.52928..
 
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2

POLYIMIDE FILMS IMPLANTED BY MANGANESE IONS:

VABISHCHEVICH, S. ; VABISHCHEVICH, N. ; BRINKEVICH, D....
HERALD OF POLOTSK STATE UNIVERSITY. Series С FUNDAMENTAL SCIENCES.  , 2024
Link: https://doi.org/10.52928..
 
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3

STRENGTH PROPERTIES OF ELECTRON IRRADIATED FILMS OF NEGATIV..:

VABISHCHEVICH, S. ; VABISHCHEVICH, N. ; BRINKEVICH, D....
HERALD OF POLOTSK STATE UNIVERSITY. Series С FUNDAMENTAL SCIENCES.  , 2023
Link: https://doi.org/10.52928..
 
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4

INDENTATION OF ELECTRON-IRRAUDED FILMS OF DIAZOQUINONE NOVO..:

VABISHCHEVICH, S. ; VABISHCHEVICH, N. ; BRINKEVICH, D..
HERALD OF POLOTSK STATE UNIVERSITY. Series С FUNDAMENTAL SCIENCES.  , 2023
Link: https://doi.org/10.52928..
 
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5

FILMS OF POSITIVE DIAZOQUINONE-NOVOLAC PHOTORESIST FP9120 I..:

VABISHCHEVICH, S. ; VABISHCHEVICH, N. ; BRINKEVICH, D..
HERALD OF POLOTSK STATE UNIVERSITY. Series С FUNDAMENTAL SCIENCES.  , 2023
Link: https://doi.org/10.52928..
 
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6

STRENGTH PROPERTIES OF PHOTORESISTS FOR EXPLOSIVE LITHOGRAP..:

VABISHCHEVICH, S. ; VABISHCHEVICH, N. ; BRINKEVICH, D....
HERALD OF POLOTSK STATE UNIVERSITY. Series С FUNDAMENTAL SCIENCES.  38 (2022)  4 - p. 49-55 , 2022
Link: https://doi.org/10.52928..
 
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7

OPTICAL AND STRENGTH PROPERTIES OF SACRIFICIAL LAYERSBASED ..:

VABISHCHEVICH, S. ; VABISHCHEVICH, N. ; BRINKEVICH, D....
HERALD OF POLOTSK STATE UNIVERSITY. Series С FUNDAMENTAL SCIENCES.  39 (2022)  11 - p. 53-58 , 2022
Link: https://doi.org/10.52928..
 
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8

Improving the stability of cutting on the basis of fractal,..:

Kabaldin, Yu. G. ; Seryi, S. V. ; Prosolovich, A. V..
Russian Engineering Research.  30 (2010)  6 - p. 587-595 , 2010
Link: https://doi.org/10.3103/..
 
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9

Influence of Nickel Impurity on the Operating Parameters of..:

Kenzhaev, Z. T. ; Zikrillaev, N. F. ; Odzhaev, V. B....
Russian Microelectronics.  53 (2024)  2 - p. 105-116 , 2024
Link: https://doi.org/10.1134/..
 
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10

Adhesion of Electron-Irradiated Diazoquinone–Novolac Photor..:

Vabishchevich, S. A. ; Vabishchevich, N. V. ; Brinkevich, S. D....
High Energy Chemistry.  58 (2024)  1 - p. 112-119 , 2024
Link: https://doi.org/10.1134/..
 
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11

IR-Fourier Spectroscopy of Attenuated Total Internal Reflec..:

Prosolovich, V. S. ; Brinkevich, D. I. ; Grinyuk, E. V....
Journal of Applied Spectroscopy.  91 (2024)  2 - p. 302-306 , 2024
Link: https://doi.org/10.1007/..
 
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12

Fourier-IR Spectroscopy of Photoresist/Silicon Structures f..:

Brinkevich, D. I. ; Grinyuk, E. V. ; Brinkevich, S. D....
Journal of Applied Spectroscopy.  90 (2024)  6 - p. 1223-1228 , 2024
Link: https://doi.org/10.1007/..
 
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13

Influence of Structural Defects on the Electrophysical Para..:

Koval'chuk, N. S. ; Lastovskii, S. B. ; Odzhaev, V. B....
Russian Microelectronics.  52 (2023)  4 - p. 276-282 , 2023
Link: https://doi.org/10.1134/..
 
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14

Radiation-Induced Alteration of the Reflection Spectra of D..:

Kharchenko, A. A. ; Brinkevich, D. I. ; Brinkevich, S. D..
High Energy Chemistry.  57 (2023)  6 - p. 498-503 , 2023
Link: https://doi.org/10.1134/..
 
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15

Electrophysical Parameters of PIN Photodiodes Irradiated wi..:

Kovalchuk, N. S. ; Lastovskii, S. B. ; Odzhaev, V. B....
Russian Microelectronics.  52 (2023)  6 - p. 504-509 , 2023
Link: https://doi.org/10.1134/..
 
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