Qunxing, Liu
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1

Proficiency Testing Scheme of Conducted disturbance at tele..:

, In: 2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC),
Jincai, Mi ; Hui, Chen ; Qunxing, Liu... - p. 299-301 , 2022
 
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2

Proficiency Testing Scheme of Conducted disturbance at main..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
Jincai, Mi ; Hui, Chen ; Qunxing, Liu... - p. 663-665 , 2020
 
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3

Characteristics and risk assessment of arsenic contaminatio..:

Mei, Xiangyang ; Qing, Hua ; Liu, Qunxing...
Journal of Physics: Conference Series.  2738 (2024)  1 - p. 012034 , 2024
 
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4

Failure Analysis and Research on Shielded-Gate Trench MOSFE:

, In: 2022 23rd International Conference on Electronic Packaging Technology (ICEPT),
Xiao, Shiman ; Chen, Jun ; Zou, Wei.. - p. 1-5 , 2022
 
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6

Comparison of fatigue life prediction methods for solder jo..:

Xia, Jiang ; Yang, Lin ; Liu, Qunxing...
Microelectronics Reliability.  95 (2019)  - p. 58-64 , 2019
 
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13

A resource of large-scale molecular markers for monitoring ..:

Zhang, Jinpeng ; Liu, Weihua ; Lu, Yuqing...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC5607264/.  , 2017
 
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