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Race, Salvatore
29  results:
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1

Evidence of Dynamic Input Capacitance of SiC Power MOSFETs:

, In: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Nagel, Michel ; Race, Salvatore ; Brandl, Anja.. - p. 128-131 , 2024
Link: https://doi.org/10.1109/..
 
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2

Comparative Study on Power Cycling Capabilities of SiC Powe..:

, In: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Kovacevic-Badstuebner, Ivana ; Mengotti, Elena ; Natzke, Philipp... - p. 518-521 , 2024
Link: https://doi.org/10.1109/..
 
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3

The Role of the Gate Resistance and Device Variability on t..:

, In: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Race, Salvatore ; Nagel, Michel ; Brandl, Anja... - p. 144-147 , 2024
Link: https://doi.org/10.1109/..
 
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4

Power Cycling of Sintered SiC Power MOSFET Baseplate-less M..:

, In: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Kovacevic-Badstuebner, Ivana ; Mengotti, Elena ; Natzke, Philipp... - p. 60-63 , 2023
Link: https://doi.org/10.1109/..
 
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5

Extended Analysis of Power Cycling Behavior of TO-Packaged ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Kovacevic-Badstuebner, Ivana ; Race, Salvatore ; Grossner, Ulrike... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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6

Temperature Dependence of the Channel and Drift Resistance ..:

Stark, Roger ; Tsibizov, Alexander ; Race, Salvatore...
Materials Science Forum.  1092 (2023)  - p. 165-170 , 2023
Link: https://doi.org/10.4028/..
 
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7

Small-Signal Impedance and Split C-V Characterization of Hi..:

Race, Salvatore ; Kovacevic-Badstuebner, Ivana ; Stark, Roger...
Materials Science Forum.  1091 (2023)  - p. 67-71 , 2023
Link: https://doi.org/10.4028/..
 
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8

Gate Impedance Analysis of SiC power MOSFETs with SiO2 and ..:

, In: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Race, Salvatore ; Kumar, Piyush ; Natzke, Philipp... - p. 9-12 , 2023
Link: https://doi.org/10.1109/..
 
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9

Mapping the impact of defect distributions in silicon carbi..:

Dorfer, Christian ; Bathen, Marianne E. ; Race, Salvatore...
Applied Physics Letters.  122 (2023)  18 - p. , 2023
Link: https://doi.org/10.1063/..
 
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10

Modeling of In-chip Current-Temperature Distribution of SiC..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Race, Salvatore ; Kovacevic-Badstuebner, Ivana ; Stark, Roger... - p. 265-268 , 2022
Link: https://doi.org/10.1109/..
 
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11

Circuit-Based Electrothermal Modeling of SiC Power Modules ..:

Race, Salvatore ; Philipp, Aron ; Nagel, Michel...
IEEE Transactions on Power Electronics.  37 (2022)  7 - p. 7965-7976 , 2022
Link: https://doi.org/10.1109/..
 
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12

Modeling Approach for Design Selection and Reliability Anal..:

, In: 2022 IEEE International Workshop on Integrated Power Packaging (IWIPP),
Kovacevic-Badstuebner, Ivana ; Race, Salvatore ; Grossner, Ulrike - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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13

Virtual PCB Layout Prototyping: Importance of Modeling Gate..:

, In: 2022 IEEE Design Methodologies Conference (DMC),
Nagel, Michel ; Race, Salvatore ; Kovacevic-Badstuebner, Ivana.. - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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14

TRAC: A Thermal Resistance Advanced Calculator for Electron..:

Codecasa, Lorenzo ; Race, Salvatore ; d'Alessandro, Vincenzo...
Energies.  12 (2019)  6 - p. 1050 , 2019
Link: https://doi.org/10.3390/..
 
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15

Thermal Resistance and Impedance Calculator (TRIC):

, In: 2019 25th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC),
Codecasa, Lorenzo ; De Viti, Francesca ; Race, Salvatore... - p. 1-5 , 2019
Link: https://doi.org/10.1109/..
 
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