E-LIB Suche - Ergebnisse für: Radamson, Henry H

1

High performance junctionless FDSOI SiGe channel p-FinFET w..:

Lin, Hongxiao ; Zhao, Xing ; Luo, Xue...
Materials Science in Semiconductor Processing. 171 (2024) - p. 108007 , 2024

Link: https://doi.org/10.1016/..

2

High-Performance Ge PIN Photodiodes on a 200 mm Insulator w..:

Yu, Jiahan ; Zhao, Xuewei ; Miao, Yuanhao...
ACS Applied Nano Materials. 7 (2024) 6 - p. 5889-5898 , 2024

Link: https://doi.org/10.1021/..

3

High-performance GeSi/Ge multi-quantum well photodetector o..:

Wang, He ; Kong, Zhenzhen ; Tan, Xinguang...
Optics Letters. 49 (2024) 10 - p. 2793 , 2024

Link: https://doi.org/10.1364/..

4

CMOS Scaling for the 5 nm Node and Beyond: Device, Process ..:

Radamson, Henry H. ; Miao, Yuanhao ; Zhou, Ziwei...
Nanomaterials. 14 (2024) 10 - p. 837 , 2024

Link: https://doi.org/10.3390/..

5

Demonstration of Germanium Vertical Gate-All-Around Field-E..:

Xie, Lu ; Zhu, Huilong ; Zhang, Yongkui...
ACS Nano. , 2023

Link: https://doi.org/10.1021/..

6

Raman Spectroscopy, Fourier Transform Infrared Spectroscopy..:

, In: Analytical Methods and Instruments for Micro- and Nanomaterials; Lecture Notes in Nanoscale Science and Technology,

Radamson, Henry H. - p. 87-114 , 2023

Link: https://doi.org/10.1007/..

7

Undoped Strained Ge Quantum Well with Ultrahigh Mobility of..:

Kong, Zhenzhen ; Li, Zonghu ; Cao, Gang...
ACS Applied Materials & Interfaces. 15 (2023) 23 - p. 28799-28805 , 2023

Link: https://doi.org/10.1021/..

8

Scanning Probe Microscopies (SPMs): Part I: Atom Force micr..:

, In: Analytical Methods and Instruments for Micro- and Nanomaterials; Lecture Notes in Nanoscale Science and Technology,

Radamson, Henry H. ; Sychugov, Ilja - p. 243-282 , 2023

Link: https://doi.org/10.1007/..

9

Analytical Methods and Instruments for Micro- and Nanomater..

Lecture Notes in Nanoscale Science and Technology, 23

Radamson, Henry H ; Hallén, Anders ; Sychugov, Ilya. - 1st ed. 2023 . , 2023

Link: https://doi.org/10.1007/..

10

Electrical Characterization of Semiconductors: I–V, C–V and..:

, In: Analytical Methods and Instruments for Micro- and Nanomaterials; Lecture Notes in Nanoscale Science and Technology,

Azarov, Alexander ; Hallén, Anders ; Radamson, Henry H. - p. 197-240 , 2023

Link: https://doi.org/10.1007/..

11

A SiGe/Si Nanostructure with Graphene Absorbent for Long Wa..:

Wang, He ; Kong, Zhenzhen ; Su, Jiale...
ACS Applied Nano Materials. 6 (2023) 17 - p. 15749-15756 , 2023

Link: https://doi.org/10.1021/..

12

Electron Microscopy:

, In: Analytical Methods and Instruments for Micro- and Nanomaterials; Lecture Notes in Nanoscale Science and Technology,

Radamson, Henry H. - p. 115-146 , 2023

Link: https://doi.org/10.1007/..

13

Review of Ge(GeSn) and InGaAs Avalanche Diodes Operating in..:

Miao, Yuanhao ; Lin, Hongxiao ; Li, Ben...
Nanomaterials. 13 (2023) 3 - p. 606 , 2023

Link: https://doi.org/10.3390/..

14

X-Ray Techniques:

, In: Analytical Methods and Instruments for Micro- and Nanomaterials; Lecture Notes in Nanoscale Science and Technology,

Radamson, Henry H. - p. 3-53 , 2023

Link: https://doi.org/10.1007/..

15

Interface Investigation on SiGe/Si Multilayer Structures: I..:

Kong, Zhenzhen ; Song, Yanpeng ; Wang, Hailing...
ACS Applied Materials & Interfaces. 15 (2023) 48 - p. 56567-56574 , 2023

Link: https://doi.org/10.1021/..