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2020 IEEE 17th India Council International Conference (INDICON) ,
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Fusion of Information for Fault Diagnosis in Analog Circuit:
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2020 IEEE 29th Asian Test Symposium (ATS) ,
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Potentiality of Data Fusion in Analog Circuit Fault Diagnos..:
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Lecture Notes in Electrical Engineering; Design and Testing of Reversible Logic ,
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An Efficient Nearest Neighbor Design for 2D Quantum Circuit:
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Lecture Notes in Electrical Engineering; Design and Testing of Reversible Logic ,
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Detection and Identification of Gate Faults in Reversible C..:
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Lecture Notes in Electrical Engineering; Design and Testing of Reversible Logic ,
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