Rahaman, H.
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1

Experimental Verification of a New Oscillation-based Test A..:

Parai, M. ; Srimani, S. ; Ghosh, K..
IETE Journal of Research.  69 (2021)  9 - p. 6255-6265 , 2021
 
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4

Fusion of Information for Fault Diagnosis in Analog Circuit:

, In: 2020 IEEE 17th India Council International Conference (INDICON),
Parai, M. ; Ghosh, K. ; Rahaman, H. - p. 1-6 , 2020
 
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5

Potentiality of Data Fusion in Analog Circuit Fault Diagnos..:

, In: 2020 IEEE 29th Asian Test Symposium (ATS),
Parai, M. ; Ghosh, K. ; Rahaman, H. - p. 1-6 , 2020
 
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6

An Efficient Nearest Neighbor Design for 2D Quantum Circuit:

, In: Lecture Notes in Electrical Engineering; Design and Testing of Reversible Logic,
Bhattacharjee, A. ; Bandyopadhyay, C. ; Mondal, B.... - p. 215-231 , 2019
 
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7

Detection and Identification of Gate Faults in Reversible C..:

, In: Lecture Notes in Electrical Engineering; Design and Testing of Reversible Logic,
 
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8

Improving the Designs of ESOP-Based Reversible Circuits:

, In: Lecture Notes in Electrical Engineering; Design and Testing of Reversible Logic,
Bandyopadhyay, C. ; Parekh, S. ; Roy, D.. - p. 49-64 , 2019
 
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9

Spin Dependent Electronic Transport in Edge Oxidized Zigzag..:

Maity, I. ; Ghosh, K. ; Rahaman, H..
Materials Today: Proceedings.  5 (2018)  3 - p. 9892-9898 , 2018
 
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10

Tuning of electronic properties of edge oxidized armchair g..:

Maity, I. ; Ghosh, K. ; Rahaman, H..
Journal of Materials Science: Materials in Electronics.  28 (2017)  12 - p. 9039-9047 , 2017
 
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11

Modeling and analysis of crosstalk induced overshoot/unders..:

Sahoo, M. ; Rahaman, H.
Microelectronics Reliability.  63 (2016)  - p. 231-238 , 2016
 
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12

Performance analysis of uniaxially strained monolayer black..:

Banerjee, L. ; Mukhopadhyay, A. ; Sengupta, A..
Journal of Computational Electronics.  15 (2016)  3 - p. 919-930 , 2016
 
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