Rajendran Omana Rajesh
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Low cost and low intrusive approach to test on-line the sch..:

, In: Proceedings of the 7th ACM international conference on Computing frontiers,
 
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Scalable Approach for Power Droop Reduction During Scan-Bas..:

Omana, Martin ; Rossi, Daniele ; Fuzzi, Filippo...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  25 (2017)  1 - p. 238-246 , 2017
 
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