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Raji, Mohsen
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1

Quantizing YOLOv7: A Comprehensive Study:

, In: 2023 28th International Computer Conference, Computer Society of Iran (CSICC),
Baghbanbashi, Mohammadamin ; Raji, Mohsen ; Ghavami, Behnam - p. 01-05 , 2023
Link: https://doi.org/10.1109/..
 
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2

Lifetime Reliability-aware Design of Integrated Circuits:

Raji, Mohsen ; Ghavami, Behnam - 1st ed. 2023 . , 2023
Link: https://doi.org/10.1007/..
 
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3

Compressing Deep Neural Networks Using Explainable AI:

, In: 2023 13th International Conference on Computer and Knowledge Engineering (ICCKE),
Soroush, Kimia ; Raji, Mohsen ; Ghavami, Behnam - p. 636-641 , 2023
Link: https://doi.org/10.1109/..
 
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4

Lifetime Reliability Improvement of Pulsed Flip-Flops:

, In: Lifetime Reliability-aware Design of Integrated Circuits,
Raji, Mohsen ; Ghavami, Behnam - p. 37-50 , 2022
Link: https://doi.org/10.1007/..
 
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5

Lifetime Reliability Optimization Algorithms of Integrated ..:

, In: Lifetime Reliability-aware Design of Integrated Circuits,
Raji, Mohsen ; Ghavami, Behnam - p. 85-105 , 2022
Link: https://doi.org/10.1007/..
 
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6

Gate Sizing-Based Lifetime Reliability Improvement of Integ..:

, In: Lifetime Reliability-aware Design of Integrated Circuits,
Raji, Mohsen ; Ghavami, Behnam - p. 51-64 , 2022
Link: https://doi.org/10.1007/..
 
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7

Reliable Circuit Design Using a Fast Incremental-Based Gate..:

Ghavami, Behnam ; Raji, Mohsen ; Ibrami, Milad.
IEEE Transactions on Device and Materials Reliability.  22 (2022)  3 - p. 371-380 , 2022
Link: https://doi.org/10.1109/..
 
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8

Restructuring-Based Lifetime Reliability Improvement of Nan..:

, In: Lifetime Reliability-aware Design of Integrated Circuits,
Raji, Mohsen ; Ghavami, Behnam - p. 19-35 , 2022
Link: https://doi.org/10.1007/..
 
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9

Impacts of Process Variations and Aging on Lifetime Reliabi..:

, In: Lifetime Reliability-aware Design of Integrated Circuits,
Raji, Mohsen ; Ghavami, Behnam - p. 1-17 , 2022
Link: https://doi.org/10.1007/..
 
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10

A Majority-based Approximate Adder for FPGAs:

, In: 2022 25th Euromicro Conference on Digital System Design (DSD),
Ghavami, Behnam ; Sajedi, Mahdi ; Raji, Mohsen.. - p. 53-59 , 2022
Link: https://doi.org/10.1109/..
 
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11

Joint Timing Yield and Lifetime Reliability Optimization of..:

, In: Lifetime Reliability-aware Design of Integrated Circuits,
Raji, Mohsen ; Ghavami, Behnam - p. 65-83 , 2022
Link: https://doi.org/10.1007/..
 
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12

A methodology for the SPICE-Compatible modelling of metal-s..:

Qodratnama, Arash ; Khunjush, Farshad ; Raji, Mohsen
Microelectronics Journal.  115 (2021)  - p. 105170 , 2021
Link: https://doi.org/10.1016/..
 
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13

A Statistical Gate Sizing Method for Timing Yield and Lifet..:

Ebrahimipour, S. M. ; Ghavami, Behnam ; Raji, Mohsen
IEEE Transactions on Emerging Topics in Computing.  9 (2021)  2 - p. 759-773 , 2021
Link: https://doi.org/10.1109/..
 
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14

Lifetime Reliability Improvement of Nano-Scale Digital Circ..:

Raji, Mohsen ; Mahmoudi, Reza ; Ghavami, Behnam.
IEEE Access.  9 (2021)  - p. 114120-114134 , 2021
Link: https://doi.org/10.1109/..
 
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15

Dynamic output feedback stabilization of deterministic fini..:

Abolpour, Roozbeh ; Raji, Mohsen ; Moradi, Parisa
Control Theory and Technology.  19 (2021)  2 - p. 170-182 , 2021
Link: https://doi.org/10.1007/..
 
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