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Rajkowski, Tomasz
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1

System-Level Total Ionizing Dose Testing of Satellite Subsy..:

Rajkowski, Tomasz ; Pustułka, Przemysław ; Bieda, Marcin...
Electronics.  13 (2023)  1 - p. 122 , 2023
Link: https://doi.org/10.3390/..
 
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2

Radiation Qualification by Means of the System-Level Testin..:

Rajkowski, Tomasz ; Saigné, Frédéric ; Wang, Pierre-Xiao
Electronics.  11 (2022)  3 - p. 378 , 2022
Link: https://doi.org/10.3390/..
 
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3

Radiation Hardness Assurance Through System-Level Testing: ..:

Coronetti, Andrea ; Alia, Ruben Garcia ; Budroweit, Jan...
IEEE Transactions on Nuclear Science.  68 (2021)  5 - p. 958-969 , 2021
Link: https://doi.org/10.1109/..
 
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4

Comparison of the Total Ionizing Dose Sensitivity of a Syst..:

Rajkowski, Tomasz ; Saigné, Frédéric ; Niskanen, Kimmo...
Electronics.  10 (2021)  11 - p. 1235 , 2021
Link: https://doi.org/10.3390/..
 
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5

Radiation Hardness Assurance Through System-Level Testing: ..:

Coronetti, Andrea ; Alia, Ruben Garcia ; Budroweit, Jan...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2021.3061197.  , 2021
Link: https://hal.science/hal-..
 
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6

Radiation Hardness Assurance Through System-Level Testing: ..:

Coronetti, Andrea ; Alia, Ruben Garcia ; Budroweit, Jan...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2021.3061197.  , 2021
Link: https://hal.science/hal-..
 
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7

Radiation hardness assurance through system-level testing: ..:

Coronetti, Andrea ; Alía, Rubén Garcia ; Budroweit, Jan...
IEEE transactions on nuclear science.  , 2021
Link: http://hdl.handle.net/11..
 
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8

Radiation Hardness Assurance Through System-Level Testing: ..:

Coronetti, Andrea ; Alia, Ruben Garcia ; Budroweit, Jan...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2021.3061197.  , 2021
Link: https://hal.science/hal-..
 
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9

Radiation hardness assurance through system-level testing :..:

Coronetti, Andrea ; Garcìa Alìa, Rubén ; Budroweit, Jan...
IEEE Transactions on Nuclear Science.  , 2021
Link: http://urn.fi/URN:NBN:fi..
 
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10

System-Level Total Ionizing Dose Testing of Satellite Subsy..:

Tomasz Rajkowski ; Przemysław Pustułka ; Marcin Bieda...
https://www.mdpi.com/2079-9292/13/1/122.  , 2023
Link: https://doi.org/10.3390/..
 
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11

Radiation Qualification by Means of the System-Level Testin..:

Tomasz Rajkowski ; Frédéric Saigné ; Pierre-Xiao Wang
Microelectronics.  , 2022
Link: https://doi.org/10.3390/..
 
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12

Radiation Qualification by Means of the System-Level Testin..:

Tomasz Rajkowski ; Frédéric Saigné ; Pierre-Xiao Wang
https://www.mdpi.com/2079-9292/11/3/378.  , 2022
Link: https://doi.org/10.3390/..
 
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13

Comparison of the Total Ionizing Dose Sensitivity of a Syst..:

Tomasz Rajkowski ; Frédéric Saigné ; Kimmo Niskanen...
Microelectronics.  , 2021
Link: https://doi.org/10.3390/..
 
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14

Comparison of the Total Ionizing Dose Sensitivity of a Syst..:

Tomasz Rajkowski ; Frédéric Saigné ; Kimmo Niskanen...
https://www.mdpi.com/2079-9292/10/11/1235.  , 2021
Link: https://doi.org/10.3390/..
 
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15

Testing of Sinters Made of Copper Powders Coated with Carbo..:

Kamil RAJKOWSKI ; Tomasz MAJEWSKI
http://promechjournal.pl/gicid/01.3001.0014.9339.  , 2021
Link: https://doi.org/10.5604/..
 
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