Reddy, Gaurav Rajavendra
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1

Session details: Analyzing Reliability, Defects and Pattern..:

, In: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design,
 
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2

CASPER: CAD Framework for a Novel Transistor-Level Programm..:

, In: 2020 IEEE International Symposium on Circuits and Systems (ISCAS),
 
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3

Machine Learning-Based Hotspot Detection: Fallacies, Pitfal..:

, In: 2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD),
 
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4

Functional Obfuscation of Hardware Accelerators through Sel..:

, In: Proceedings of the 2019 Great Lakes Symposium on VLSI,
Hu, Bo ; Tian, Jingxiang ; Shihab, Mustafa... - p. 171-176 , 2019
 
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Design Space Exploration for Hotspot Detection:

, In: 2019 20th International Workshop on Microprocessor/SoC Test, Security and Verification (MTV),
 
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