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Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design ,
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Session details: Analyzing Reliability, Defects and Pattern..:
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2020 IEEE International Symposium on Circuits and Systems (ISCAS) ,
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CASPER: CAD Framework for a Novel Transistor-Level Programm..:
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2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) ,
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Machine Learning-Based Hotspot Detection: Fallacies, Pitfal..:
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Proceedings of the 2019 Great Lakes Symposium on VLSI ,
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Functional Obfuscation of Hardware Accelerators through Sel..:
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2019 IEEE International Test Conference (ITC) ,
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VIPER: A Versatile and Intuitive Pattern GenERator for Earl..:
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2020 IEEE 38th VLSI Test Symposium (VTS) ,
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ATTEST: Application-Agnostic Testing of a Novel Transistor-..:
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2019 20th International Workshop on Microprocessor/SoC Test, Security and Verification (MTV) ,
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