Reis, Daniel Monteiro Diniz
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1

Defects and Resistance Degradation of Sputtered Doped Lead ..:

, In: 2021 IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM),
 
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2

New Insight Into Defects and Degradation Kinetics in Lead Z..:

, In: 2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF),
 
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3

Leakage Current in Low-Temperature PVD PZT Films:

, In: 2019 IEEE International Symposium on Applications of Ferroelectrics (ISAF),
 
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4

Defect-controlled Resistance Degradation of Sputtered Lead ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Ho, Kuan-Ting ; Diniz Reis, Daniel Monteiro ; Hiller, Karla - p. 10C.2-1-10C.2-6 , 2022
 
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