Renner, F.U.
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1

Electrodeposition of silicon films from organic solvents on..:

Vivegnis, S. ; Baudhuin, L.-C. ; Delhalle, J...
Journal of Applied Electrochemistry.  54 (2023)  1 - p. 77-88 , 2023
 
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2

XPS fast depth profile of the native oxide layers on AISI 3..:

Detriche, S. ; Vivegnis, S. ; Vanhumbeeck, J.-F....
Journal of Electron Spectroscopy and Related Phenomena.  243 (2020)  - p. 146970 , 2020
 
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3

Inclusion of Water in Cu(In, Ga)Se2 Absorber Material Durin..:

Kohl, Thierry ; Rivas, N. A. ; de Wild, J....
ACS Applied Energy Materials.  3 (2020)  6 - p. 5120-5125 , 2020
 
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4

Use of pyrophosphate and boric acid additives in the copper..:

Vivegnis, S. ; Krid, M. ; Delhalle, J...
Journal of Electroanalytical Chemistry.  848 (2019)  - p. 113310 , 2019
 
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6

Dealloying on the Atomic Scale:

, In: Encyclopedia of Interfacial Chemistry,
Renner, F.U. ; Oezaslan, M. - p. 32-43 , 2018
 
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9

X-ray Photoelectron Spectroscopy (XPS) analysis of low oxid..:

Izzuddin, H ; Seemayer, A ; Ankah, G N...
Journal of Physics: Conference Series.  817 (2017)  - p. 012070 , 2017
 
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13

Glass-formation and corrosion properties of Fe–Cr–Mo–C–B gl..:

Madinehei, M. ; Bruna, P. ; Duarte, M.J....
Journal of Alloys and Compounds.  615 (2014)  - p. S128-S131 , 2014
 
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