Rettenberger, A.
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1

Imaging of dopants in surface and sub-surface layers of the..:

Matthes, T.W. ; Sommerhalter, C. ; Rettenberger, A....
Applied Physics A: Materials Science & Processing.  66 (1998)  7 - p. S1007-S1011 , 1998
 
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3

New design of a variable-temperature ultrahigh vacuum scann..:

Mugele, F. ; Rettenberger, A. ; Boneberg, J..
Review of Scientific Instruments.  69 (1998)  4 - p. 1765-1769 , 1998
 
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7

Atomic Force Microscope Based Kelvin Probe Measurements:  A..:

Böhmisch, M. ; Burmeister, F. ; Rettenberger, A....
The Journal of Physical Chemistry B.  101 (1997)  49 - p. 10162-10165 , 1997
 
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14

Fault Detection in 3D-Printing with Deep Learning:

, In: 2024 IEEE International Conference on Consumer Electronics (ICCE),
 
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