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Ribotta, Luigi
18  results:
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1

AFM interlaboratory comparison for nanodimensional metrolog..:

Ribotta, Luigi ; Delvallée, Alexandra ; Cara, Eleonora...
Measurement Science and Technology.  35 (2024)  10 - p. 105014 , 2024
Link: https://doi.org/10.1088/..
 
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2

AFM Measurements and Tip Characterization of Nanoparticles ..:

Bellotti, Roberto ; Picotto, Gian Bartolo ; Ribotta, Luigi
Nanomanufacturing and Metrology.  5 (2022)  2 - p. 127-138 , 2022
Link: https://doi.org/10.1007/..
 
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3

Quantitative three-dimensional characterization of critical..:

Maurino, Valter ; Pellegrino, Francesco ; Picotto, Gian Bartolo.
Ultramicroscopy.  234 (2022)  - p. 113480 , 2022
Link: https://doi.org/10.1016/..
 
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4

Tip–sample characterization in the AFM study of a rod-shape..:

Picotto, Gian Bartolo ; Vallino, Marta ; Ribotta, Luigi
Measurement Science and Technology.  31 (2020)  8 - p. 084001 , 2020
Link: https://doi.org/10.1088/..
 
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5

Dimensional metrology at the nanoscale: quantitative charac..:

RIBOTTA, LUIGI
firstpage:1.  , 2022
Link: https://hdl.handle.net/1..
 
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6

AFM Measurements and Tip Characterization of Nanoparticles ..:

Bellotti Roberto ; Picotto Gian Bartolo ; Ribotta Luigi
numberofpages:12.  , 2022
Link: https://hdl.handle.net/1..
 
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7

Tip-sample characterization in the AFM study of a rod-shape..:

Picotto, Gian Bartolo ; Vallino, Marta ; Ribotta, Luigi
info:eu-repo/semantics/altIdentifier/wos/WOS:000538481300001.  , 2020
Link: http://hdl.handle.net/11..
 
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8

Metrologia di superfici funzionali per la caratterizzazione..:

Valentina Furin ; Gian Bartolo Picotto ; RIBOTTA, LUIGI
ispartofbook:A&T - Automation & Testing - LA FIERA DEDICATA A INDUSTRIA 4.0, MISURE E PROVE, ROBOTICA, TECNOLOGIE INNOVATIVE.  , 2019
Link: http://hdl.handle.net/11..
 
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9

3D characterization of printed structures by stylus- and op..:

Bellotti, Roberto ; Maras, Claire ; Picotto, Gian Bartolo..
info:eu-repo/semantics/altIdentifier/isbn/978-0-9957751-2-1.  , 2018
Link: http://hdl.handle.net/11..
 
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10

Quantitative three-dimensional characterization of critical..:

valter maurino ; francesco pellegrino ; gian bartolo picotto.
info:eu-repo/semantics/altIdentifier/wos/WOS:000821463400004.  , 2022
Link: https://hdl.handle.net/1..
 
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11

AFM Measurements and Tip Characterization of Nanoparticles ..:

Roberto Bellotti ; Gian Bartolo Picotto ; Luigi Ribotta
numberofpages:12.  , 2022
Link: http://hdl.handle.net/11..
 
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12

Quantitative three-dimensional characterization of critical..:

valter maurino ; francesco pellegrino ; gian bartolo picotto.
info:eu-repo/semantics/altIdentifier/wos/WOS:000821463400004.  , 2022
Link: http://hdl.handle.net/11..
 
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13

Dimensional metrology at the nanoscale: quantitative charac..:

Luigi Ribotta
https://hdl.handle.net/11696/78699.  , 2022
Link: https://hdl.handle.net/1..
 
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14

Atomic force microscopy metrology of non-spherical nanopart..:

Valter MAURINO ; Francesco PELLEGRINO ; Gian Bartolo PICOTTO.
info:eu-repo/semantics/altIdentifier/isbn/978-88-7438-123-4.  , 2020
Link: http://hdl.handle.net/11..
 
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15

Optical measurements of morphology-to-functional parameters..:

Roberto Bellotti ; Valentina Furin ; Alessandro Marsura..
info:eu-repo/semantics/altIdentifier/wos/WOS:000485176500001.  , 2019
Link: http://hdl.handle.net/11..
 
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