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2007 IEEE International Workshop on Memory Technology, Design and Testing ,
1
Future trend of flash memories:
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2007 IEEE International Electron Devices Meeting ,
5
A NAND-type Flash Memory Using Impact Ionization Generated ..:
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2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
6
A BE-SONOS (Bandgap Engineered SONOS) NAND for Post-Floatin..:
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2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
7