Riedl, T.
903  results:
Search for persons X
?
6

From diffusive in-plane to ballistic out-of-plane heat tran..:

Heiderhoff, R. ; Haeger, T. ; Dawada, K..
Microelectronics Reliability.  76-77 (2017)  - p. 222-226 , 2017
 
?
 
?
12

Reliability of high‐resolution electron backscatter diffrac..:

Riedl, T. ; Wendrock, H.
Crystal Research and Technology.  49 (2014)  4 - p. 195-203 , 2014
 
?
13

Direct arylation polycondensation as simplified alternative..:

Kowalski, S. ; Allard, S. ; Zilberberg, K...
Progress in Polymer Science.  38 (2013)  12 - p. 1805-1814 , 2013
 
?
14

Transparent OLED displays:

, In: Organic Light-Emitting Diodes (OLEDs),
Meyer, J. ; Görrn, P. ; Riedl, T. - p. 512-547 , 2013
 
?
15

Dynamic Near-Field Scanning Thermal Microscopy on thin film:

Heiderhoff, R. ; Li, H. ; Riedl, T.
Microelectronics Reliability.  53 (2013)  9-11 - p. 1413-1417 , 2013
 
1-15