Rigoudy, C.
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1

Study of the Electrical Properties of Thin Silica Layers wi..:

, In: 2022 IEEE 4th International Conference on Dielectrics (ICD),
Rigoudy, C. ; Makasheva, K. ; Villeneuve-Faure, C... - p. 273-276 , 2022
 
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3

Rational Engineering of the Dielectric Properties of Thin S..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
Rigoudy, C. ; Makasheva, K. ; Belhaj, M.... - p. 205-208 , 2020
 
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4

Study of the Electrical Properties of Thin Silica Layers wi..:

Rigoudy, C ; Makasheva, Kremena ; Villeneuve-Faure, C..
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICD53806.2022.9863598.  , 2022
 
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5

Study of the Electrical Properties of Thin Silica Layers wi..:

Rigoudy, C ; Makasheva, Kremena ; Villeneuve-Faure, C..
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICD53806.2022.9863598.  , 2022
 
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