E-LIB Suche - Ergebnisse für: Rocher, André

1

TEM evaluation of epitaxial strain in III–V semi-conductors..:

Rocher, André ; Ponchet, Anne ; Blanc, Stéphanie.
Applied Surface Science. 188 (2002) 1-2 - p. 55-60 , 2002

Link: https://doi.org/10.1016/..

2

Misfit dislocations in (001) semiconductor heterostructures..:

Rocher, André ; Snoeck, Etienne
Materials Science and Engineering: B. 67 (1999) 1-2 - p. 62-69 , 1999

Link: https://doi.org/10.1016/..

3

Studies of metamorphic III–V heterostructures by digital pr..:

Rocher, André ; Snoeck, Etienne
Thin Solid Films. 319 (1998) 1-2 - p. 172-176 , 1998

Link: https://doi.org/10.1016/..

4

Charged Defects at the Interface between Directly Bonded Si..:

Laporte, Angeline ; Sarrabayrouse, Gérard ; Benamara, Mourad...
Japanese Journal of Applied Physics. 36 (1997) 9R - p. 5502 , 1997

Link: https://doi.org/10.1143/..

5

Structural and electrical investigations of silicon wafer b..:

Benamara, Mourad ; Rocher, André ; Sopéna, Pierre...
Materials Science and Engineering: B. 42 (1996) 1-3 - p. 164-167 , 1996

Link: https://doi.org/10.1016/..

6

GaSb/GaAs heteroepitaxy characterized as a stress-free syst..:

Raisin, Claude ; Rocher, André ; Landa, Georges..
Applied Surface Science. 50 (1991) 1-4 - p. 434-439 , 1991

Link: https://doi.org/10.1016/..

7

Oriented overgrowths in MOVPE-grown GaAs:

Rudra, Alok ; Grenet, Jean-Claude ; Gibart, Pierre..
Journal of Crystal Growth. 87 (1988) 4 - p. 535-546 , 1988

Link: https://doi.org/10.1016/..

8

High-resolution electron microscopy study of (Ca,Sr)F2/GaAs..:

Héral, Hélène ; Bernard, Louis ; Rocher, André..
Journal of Applied Physics. 61 (1987) 6 - p. 2410-2412 , 1987

Link: https://doi.org/10.1063/..

9

TEM observations of grain boundaries in silicon:

Rocher, André
Journal of Crystal Growth. 65 (1983) 1-3 - p. 681-682 , 1983

Link: https://doi.org/10.1016/..

10

Polycristalline Semiconductors. Colloque International du C..

Journal de Physique. Colloque ; Nr. 1, 1982

Rocher, André , 1982

Copies: Zentrale:Magazin 03.h.7885

11

Papers presented at the European Materials Research Society..

[ICAM/E-MRS Spring Conference, Symposium C: Recent Developm... Thin solid films ; 319.1998,1/2

Rocher, André M. , 1998

Copies: Zentrale:Magazinturm-E02 15z phy 957 jb/588-319

12

L'Étude de la Structure Électronique des Métaux des Terres ..:

Rocher, Yves-André
Advances in Physics. 11 (1962) 43 - p. 233-279 , 1962

Link: https://doi.org/10.1080/..

13

Silicium polycristallin:

Equer, Bernard ; Pinard, Pierre ; Rocher, André.
info:eu-repo/semantics/altIdentifier/doi/10.1051/rphysap:01987002207051100. , 1987

Link: https://hal.archives-ouv..

14

Polycrystalline silicon:

Equer, Bernard ; Pinard, Pierre ; Rocher, André.
info:eu-repo/semantics/altIdentifier/doi/10.1051/rphysap:01987002207051300. , 1987

Link: https://hal.archives-ouv..

15

Contrastes simulés au croisement de défauts d'empilement:

Rocher, André ; Jouffrey, Bernard
info:eu-repo/semantics/altIdentifier/doi/10.1051/rphysap:0196900404052500. , 1969

Link: https://hal.archives-ouv..