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Rodbell, Kenneth P.
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1

Challenges facing copper‐plated metallisation for silicon p..:

Lennon, Alison ; Colwell, Jack ; Rodbell, Kenneth P.
Progress in Photovoltaics: Research and Applications.  27 (2018)  1 - p. 67-97 , 2018
Link: https://doi.org/10.1002/..
 
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2

Measurements of radioactive contaminants in semiconductor m..:

Gordon, Michael S ; Rodbell, Kenneth P ; Murray, Conal E.
Semiconductor Science and Technology.  31 (2016)  12 - p. 123003 , 2016
Link: https://doi.org/10.1088/..
 
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3

Single-Event Upsets in Microelectronics: Fundamental Physic..:

Tang, Henry H.K. ; Rodbell, Kenneth P.
MRS Bulletin.  28 (2003)  2 - p. 111-116 , 2003
Link: https://doi.org/10.1557/..
 
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4

Preview: 2002 MRS Spring Meeting:

Bao, Zhenan ; Fitzgerald, Eugene A. ; Goesele, Ulrich M..
MRS Bulletin.  27 (2002)  2 - p. 142-154 , 2002
Link: https://doi.org/10.1557/..
 
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5

Porosity characterization by beam-based three-photon positr..:

Petkov, Mihail P. ; Weber, Marc H. ; Lynn, Kelvin G..
Applied Physics Letters.  79 (2001)  23 - p. 3884-3886 , 2001
Link: https://doi.org/10.1063/..
 
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6

Probing capped and uncapped mesoporous low-dielectric const..:

Petkov, Mihail P. ; Weber, Marc H. ; Lynn, Kelvin G..
Applied Physics Letters.  77 (2000)  16 - p. 2470-2472 , 2000
Link: https://doi.org/10.1063/..
 
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7

Doppler broadening positron annihilation spectroscopy: A te..:

Petkov, Mihail P. ; Weber, Marc H. ; Lynn, Kelvin G...
Applied Physics Letters.  74 (1999)  15 - p. 2146-2148 , 1999
Link: https://doi.org/10.1063/..
 
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8

Open volume defects (measured by positron annihilation spec..:

Petkov, Mihail P. ; Weber, Marc H. ; Lynn, Kelvin G...
Journal of Applied Physics.  86 (1999)  6 - p. 3104-3109 , 1999
Link: https://doi.org/10.1063/..
 
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9

Environmental radiation impact on lifetimes and quasipartic..:

Gordon, R. T. ; Murray, C. E. ; Kurter, C....
Applied Physics Letters.  120 (2022)  7 - p. , 2022
Link: https://doi.org/10.1063/..
 
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10

Alpha particle mitigation strategies to reduce chip soft er..:

Cabral Jr., C. ; Rodbell, K. P. ; Gordon, M. S.
Journal of Applied Physics.  101 (2007)  1 - p. , 2007
Link: https://doi.org/10.1063/..
 
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11

Metal-Organic Atomic Layer Deposition of Metals for Applica..:

van der Straten, Oscar ; Rossnagel, S.M. ; Doyle, J.P..
ECS Transactions.  1 (2006)  10 - p. 51-56 , 2006
Link: https://doi.org/10.1149/..
 
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12

Underlayer effects on texture evolution in copper films:

Murray, C.E. ; Rodbell, K.P. ; Vereecken, P.M.
Thin Solid Films.  503 (2006)  1-2 - p. 207-211 , 2006
Link: https://doi.org/10.1016/..
 
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13

Studies of deformation-induced texture development in sheet..:

Banovic, S.W. ; Vaudin, M.D. ; Gnaeupel-Herold, T.H...
Materials Science and Engineering: A.  380 (2004)  1-2 - p. 155-170 , 2004
Link: https://doi.org/10.1016/..
 
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14

Evolution of microstructure in Ti–Ta bilayer thin films on ..:

Özcan, A.S. ; Ludwig, Jr, K.F. ; Lavoie, C....
Thin Solid Films.  466 (2004)  1-2 - p. 238-249 , 2004
Link: https://doi.org/10.1016/..
 
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15

Positron Annihilation Techniques Suited for Porosity Charac..:

Petkov, M. P. ; Wang, C. L. ; Weber, M. H...
The Journal of Physical Chemistry B.  107 (2003)  12 - p. 2725-2734 , 2003
Link: https://doi.org/10.1021/..
 
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