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Roijen, Raymond Van
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1

Observation of Pattern Sensitivity In Laser anneal : Topic/..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
van Roijen, Raymond ; Hurley, Mark ; Mirdha, Pial. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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2

Uniformity and Yield Optimization for a highly diverse Prod..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Roijen, Raymond Van ; Lucksinger, Mark ; Fields, Matthew... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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3

Datamining for yield:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Roijen, Raymond Van ; Maxson, Jeffery B. ; Brodfuehrer, Michael... - p. 315-319 , 2017
Link: https://doi.org/10.1109/..
 
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4

InP-based integrated optical components:

Van Roijen, Raymond ; Verbeek, Bart H.
Philips Journal of Research.  49 (1995)  3 - p. 279-292 , 1995
Link: https://doi.org/10.1016/..
 
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5

Fabrication of low-loss integrated optical corner mirrors:

van Roijen, Raymond ; van der Hofstad, Geert L. A. ; Groten, Maurice...
Applied Optics.  32 (1993)  18 - p. 3246 , 1993
Link: https://doi.org/10.1364/..
 
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Damage caused by Cl2 based dry etching of III–V materials:

van Roijen, Raymond ; Bulle-Lieuwma, CWT
Vacuum.  44 (1993)  3-4 - p. 231 , 1993
Link: https://doi.org/10.1016/..
 
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7

Core Discrete Event Simulation Model for the Evaluation of ..:

Vataire, Anne-Lise ; Aballéa, Samuel ; Antonanzas, Fernando...
Value in Health.  17 (2014)  2 - p. 183-195 , 2014
Link: https://doi.org/10.1016/..
 
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