Roisin, Nicolas
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2

SPICE Model of SPAD Transient Intrinsic Response Validated ..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
 
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4

Raman strain–shift measurements and prediction from first-p..:

Roisin, Nicolas ; Colla, Marie-Stéphane ; Raskin, Jean-Pierre.
Journal of Materials Science: Materials in Electronics.  34 (2023)  5 - p. , 2023
 
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5

Near-IR response of highly-strained Si photodetector linkin..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
 
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