Rollo, Tommaso
23  results:
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1

Blocking Oxide Material Engineering to Improve Retention Lo..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Rollo, Tommaso ; Lo, Hansel ; Larcher, Luca.. - p. 1-5 , 2024
 
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2

Insights into device and material origins and physical mech..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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3

A review of selected topics in physics based modeling for t..:

Esseni, David ; Pala, Marco ; Palestri, Pierpaolo..
Semiconductor Science and Technology.  32 (2017)  8 - p. 083005 , 2017
 
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4

Tunnel FETs for Ultralow Voltage Digital VLSI Circuits: Par..:

Esseni, David ; Guglielmini, Manuel ; Kapidani, Bernard..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  22 (2014)  12 - p. 2488-2498 , 2014
 
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6

A review of selected topics in physics based modeling for t..:

ESSENI, David ; Pala, Marco ; PALESTRI, Pierpaolo..
info:eu-repo/semantics/altIdentifier/wos/WOS:000406006600002.  , 2017
 
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7

A review of selected topics in physics based modeling for t..:

ESSENI, David ; Pala, Marco ; PALESTRI, Pierpaolo..
info:eu-repo/semantics/altIdentifier/wos/WOS:000406006600002.  , 2017
 
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8

Stabilization of negative capacitance in ferroelectric capa..:

Tommaso Rollo ; David Esseni ; Giulia Giordano..
info:eu-repo/semantics/altIdentifier/wos/WOS:000520487300037.  , 2020
 
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11

The AMPERE Project: : A Model-driven development framework ..:

, In: 2020 IEEE 23rd International Symposium on Real-Time Distributed Computing (ISORC),
 
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