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Ronchi, Nicolo'
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1

Electron emission from deep traps in HfO2 under thermal and..:

Izmailov, Roman ; Strand, Jack ; Ronchi, Nicolo'..
Physical Review B.  109 (2024)  13 - p. , 2024
Link: https://doi.org/10.1103/..
 
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2

A Theoretical Analysis of Ferroelectric Switching Physics i..:

Chen, Zhuo ; Ronchi, Nicolò ; Tang, Hongwei...
IEEE Electron Device Letters.  , 2024
Link: https://doi.org/10.1109/..
 
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3

Improved MW of IGZO-channel FeFET by Reading Scheme Optimiz..:

, In: 2023 IEEE International Memory Workshop (IMW),
Chen, Zhuo ; Ronchi, Nicolo ; Walke, Amey... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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4

Analysis of Wake-Up Reversal Behavior Induced by Imprint in..:

Lee, Sumi ; Ronchi, Nicolò ; Bizindavyi, Jasper...
IEEE Transactions on Electron Devices.  70 (2023)  5 - p. 2568-2574 , 2023
Link: https://doi.org/10.1109/..
 
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5

Comprehensive Investigation of Constant Voltage Stress Time..:

Chang, Ting-Yu ; Wang, Kuan-Chi ; Liu, Hsien-Yang...
Nanomaterials.  13 (2023)  14 - p. 2104 , 2023
Link: https://doi.org/10.3390/..
 
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6

Relaxation analysis to understand positive bias induced tra..:

Wang, Yu-Yun ; Wang, Kuan-Chi ; Chang, Ting-Yu...
Microelectronics Reliability.  138 (2022)  - p. 114680 , 2022
Link: https://doi.org/10.1016/..
 
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7

Impacts of Pulsing Schemes on the Endurance of Ferroelectri..:

Wu, Cheng-Hung ; Ronchi, Nicolo' ; Wang, Kuan-Chi...
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 109-114 , 2022
Link: https://doi.org/10.1109/..
 
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8

Demonstration of 64 Conductance States and Large Dynamic Ra..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Wang, Yu-Yun ; Wang, Kuang-Chi ; Wu, Cheng-Hung... - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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9

Ferroelectric La‐Doped ZrO2/HfxZr1−xO2 Bilayer Stacks with ..:

Popovici, Mihaela ; Walke, Amey M. ; Banerjee, Kaustuv...
physica status solidi (RRL) – Rapid Research Letters.  15 (2021)  5 - p. , 2021
Link: https://doi.org/10.1002/..
 
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10

Elucidating possible crystallographic origins of wake-up me..:

McMitchell, Sean R. C. ; Clima, Sergiu ; Ronchi, Nicolo'...
Applied Physics Letters.  118 (2021)  9 - p. , 2021
Link: https://doi.org/10.1063/..
 
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11

Program/Erase Scheme for Suppressing Interface Trap Generat..:

Min, Jinhong ; Ronchi, Nicolo ; McMitchell, Sean R. C....
IEEE Electron Device Letters.  42 (2021)  9 - p. 1280-1283 , 2021
Link: https://doi.org/10.1109/..
 
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12

Endurance of ferroelectric La-doped HfO2 for SFS gate-stack..:

, In: 2020 IEEE International Memory Workshop (IMW),
Ronchi, Nicolo ; McMitchell, Sean ; Min, Jinhong... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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13

Impact of interface layer on charge trapping in Si:HfO2 bas..:

, In: 2020 IEEE International Integrated Reliability Workshop (IIRW),
Jung, Taehwan ; O'Sullivan, Barry ; Ronchi, Nicolo... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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14

Leakage and trapping characteristics in Au‐free AlGaN/GaN S..:

Hu, Jie ; Stoffels, Steve ; Lenci, Silvia...
physica status solidi (a).  213 (2016)  5 - p. 1229-1235 , 2016
Link: https://doi.org/10.1002/..
 
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15

Investigation of constant voltage off-state stress on Au-fr..:

Hu, Jie ; Stoffels, Steve ; Lenci, Silvia...
Japanese Journal of Applied Physics.  54 (2015)  4S - p. 04DF07 , 2015
Link: https://doi.org/10.7567/..
 
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