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Rossetto, Isabella
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1

Field and hot electron-induced degradation in GaN-based pow..:

Tajalli, Alaleh ; Meneghini, Matteo ; Rossetto, Isabella...
Microelectronics Reliability.  76-77 (2017)  - p. 282-286 , 2017
Link: https://doi.org/10.1016/..
 
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2

Gate Stability of GaN-Based HEMTs with P-Type Gate:

Meneghini, Matteo ; Rossetto, Isabella ; Rizzato, Vanessa...
Electronics.  5 (2016)  2 - p. 14 , 2016
Link: https://doi.org/10.3390/..
 
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3

Study of the stability of e-mode GaN HEMTs with p-GaN gate ..:

Rossetto, Isabella ; Meneghini, Matteo ; Rizzato, Vanessa...
Microelectronics Reliability.  64 (2016)  - p. 547-551 , 2016
Link: https://doi.org/10.1016/..
 
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4

Trapping and reliability issues in GaN-based MIS HEMTs with..:

Meneghesso, Gaudenzio ; Meneghini, Matteo ; Bisi, Davide...
Microelectronics Reliability.  58 (2016)  - p. 151-157 , 2016
Link: https://doi.org/10.1016/..
 
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5

Trapping phenomena in AlGaN/GaN HEMTs: a study based on pul..:

Meneghesso, Gaudenzio ; Meneghini, Matteo ; Bisi, Davide...
Semiconductor Science and Technology.  28 (2013)  7 - p. 074021 , 2013
Link: https://doi.org/10.1088/..
 
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6

(Invited) Electric-Field and Thermally-Activated Failure Me..:

Zanoni, Enrico ; Meneghesso, Gaudenzio ; Meneghini, Matteo...
ECS Transactions.  41 (2011)  8 - p. 237-249 , 2011
Link: https://doi.org/10.1149/..
 
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7

ESD sensitivity of a GaAs MMIC microwave power amplifier:

Tazzoli, Augusto ; Rossetto, Isabella ; Zanoni, Enrico...
Microelectronics Reliability.  51 (2011)  9-11 - p. 1602-1607 , 2011
Link: https://doi.org/10.1016/..
 
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8

Transmission Line Pulse (TLP) as integrative method for the..:

Merlo, Luca ; Rossetto, Isabella ; Cerati, Lorenzo...
http://arxiv.org/abs/2002.08716.  , 2020
Link: http://arxiv.org/abs/200..
 
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9

Evidence of Time-Dependent Vertical Breakdown in GaN-on-Si ..:

Borga, Matteo ; Meneghini, Matteo ; Rossetto, Isabella...
info:eu-repo/semantics/altIdentifier/wos/WOS:000408118700013.  , 2017
Link: http://hdl.handle.net/11..
 
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10

Gate stability of GaN-Based HEMTs with P-Type Gate:

MENEGHINI, MATTEO ; ROSSETTO, ISABELLA ; MENEGHESSO, GAUDENZIO...
info:eu-repo/semantics/altIdentifier/wos/WOS:000380002600001.  , 2016
Link: http://hdl.handle.net/11..
 
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11

From GaAs to GaN technology: study of limits and reliabilit..:

Rossetto, Isabella
alleditors:Ferrari, Carlo.  , 2014
Link: http://hdl.handle.net/11..
 
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12

Gate Stability of GaN-Based HEMTs with P-Type Gate:

Matteo Meneghini ; Isabella Rossetto ; Vanessa Rizzato...
https://zenodo.org/record/49359.  , 2016
Link: https://zenodo.org/recor..
 
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13

Gate Stability of GaN-Based HEMTs with P-Type Gate:

Matteo Meneghini ; Isabella Rossetto ; Vanessa Rizzato...
Microelectronics.  , 2016
Link: https://doi.org/10.3390/..
 
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14

Looking for a preventive approach to sexual harassment in a..:

Zara, Georgia ; Binik, Oriana ; Ginocchio, Debora...
European Journal on Criminal Policy and Research.  , 2024
Link: https://doi.org/10.1007/..
 
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15

Intra-familiar homicides: From 2006 to 2021 in the judicial..:

Vignali, Giulia ; Blandino, Alberto ; Rossetto, Ilaria.
Journal of Forensic and Legal Medicine.  93 (2023)  - p. 102453 , 2023
Link: https://doi.org/10.1016/..
 
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