Rottner, L
726  results:
Search for persons X
?
5

In-Depth Analysis of Transistor Influence on OxRAM Performa..:

Berthaud, F. ; Martin, S. ; Rottner, J....
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2721-2728 , 2024
 
?
11

Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Meli, V. ; Navarro, G. ; Rottner, J.... - p. 1-5 , 2023
 
?
12

Automated shunt reactors for MV feeders upper voltage const..:

, In: 27th International Conference on Electricity Distribution (CIRED 2023),
 
1-15
Related subjects