E-LIB Suche - Ergebnisse für: Roussel, Ph

1

Possible Origins, Identification, and Screening of Silent D..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Sangani, D. ; Kaczer, B. ; Weckx, P.... - p. 1-7 , 2024

Link: https://doi.org/10.1109/..

2

BEOL tip-to-tip dielectric reliability characterization usi..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Fang, Y. ; Lesniewska, A. ; Ciofi, I.... - p. 1-7 , 2024

Link: https://doi.org/10.1109/..

3

De-Coupling Thermo-Migration from Electromigration Using a ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Pedreira, O. Varela ; Ding, Y. ; Coenen, D.... - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

4

Line-to-Line TDDB Modeling: LER Specs for Sub-20-nm Pitch I..:

Fang, Yu ; Ciofi, I. ; Roussel, Ph. J....
IEEE Transactions on Electron Devices. 70 (2023) 8 - p. 4332-4337 , 2023

Link: https://doi.org/10.1109/..

5

Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),

Alam, Md Nur K. ; Higashi, Yusuke ; Truijen, B.... - p. 340-342 , 2022

Link: https://doi.org/10.1109/..

6

A new methodology for modeling Air-Gap TDDB:

, In: 2022 IEEE International Interconnect Technology Conference (IITC),

Fang, Yu ; Ciofi, I. ; Roussel, Ph.... - p. 67-69 , 2022

Link: https://doi.org/10.1109/..

7

Reliability Evaluation of Semi-damascene Ru/Air-Gap interco..:

, In: 2022 IEEE International Interconnect Technology Conference (IITC),

Lesniewska, A. ; Pedreira, O. Varela ; Roussel, Ph. J.... - p. 28-30 , 2022

Link: https://doi.org/10.1109/..

8

Flash-over propagation simulation upon spacecrafts solar pa..:

Monnin, L. ; Hess, S. L. G. ; Roussel, J.-F...
Journal of Applied Physics. 130 (2021) 22 - p. , 2021

Link: https://doi.org/10.1063/..

9

HfZrO Ferroelectric Characterization and Parameterization o..:

, In: 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S),

Alam, Md Nur K. ; Thesberg, M. ; Kaczer, B.... - p. 1-3 , 2019

Link: https://doi.org/10.1109/..

10

Emotional hyper‐reactivity and cardiometabolic risk in remi..:

Dargél, A. A. ; Roussel, F. ; Volant, S....
Acta Psychiatrica Scandinavica. 138 (2018) 4 - p. 348-359 , 2018

Link: https://doi.org/10.1111/..

11

A brief overview of gate oxide defect properties and their ..:

Kaczer, B. ; Franco, J. ; Weckx, P....
Microelectronics Reliability. 81 (2018) - p. 186-194 , 2018

Link: https://doi.org/10.1016/..

12

LER and spacing variability on BEOL TDDB using E-field mapp..:

Kocaay, D. ; Roussel, Ph.J. ; Croes, K....
Microelectronics Reliability. 76-77 (2017) - p. 131-135 , 2017

Link: https://doi.org/10.1016/..

13

XXL connection and disconnection:

, In: 2017 12th International Conference on Live Maintenance (ICOLIM),

Roussel, F ; Ebeire, G - p. 1-5 , 2017

Link: https://doi.org/10.1109/..

14

Aging of Thermal Coatings on Low Earth Orbit: In-Flight Mea..:

Vanhove, E. ; Roussel, J. F. ; Remaury, Stéphanie..
Journal of Spacecraft and Rockets. 53 (2016) 6 - p. 1141-1145 , 2016

Link: https://doi.org/10.2514/..

15

A radiation belt disturbance study from the space weather p..:

Rochel, S. ; Boscher, D. ; Benacquista, R..
Acta Astronautica. 128 (2016) - p. 650-656 , 2016

Link: https://doi.org/10.1016/..