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Sagae, Takahide
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Reliability under High Gate-Voltage Condition on SiC MOSFET..:

, In: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia),
Wada, Keiji ; Sagae, Takahide ; Hayashi, Shin-Ichiro - p. 3280-3283 , 2024
Link: https://doi.org/10.1109/..
 
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Addition of allyl bromide to phenylacetylene catalyzed by p..:

Fukuyama, Takahide ; Kippo, Takashi ; Ryu, Ilhyong.
Research on Chemical Intermediates.  35 (2009)  8-9 - p. 1053-1057 , 2009
Link: https://doi.org/10.1007/..
 
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