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Salame, C.
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1

Food emulsifiers and risk of type 2 diabetes: results from ..:

Salame, C ; Srour, B ; Viennois, E...
European Journal of Public Health.  33 (2023)  Supplement_2 - p. , 2023
Link: https://doi.org/10.1093/..
 
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2

Investigation of the Monocrystalline Silicon Solar Cell Phy..:

Abdullah, K. Al ; Alloush, Faisal Al ; Salame, C.
Energy Procedia.  50 (2014)  - p. 30-40 , 2014
Link: https://doi.org/10.1016/..
 
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3

Comparison between positive and negative bias stress on N‐c..:

Abboud, N. ; Habch, R. ; Cuminal, Y...
International Journal of Structural Integrity.  4 (2013)  2 - p. 267-274 , 2013
Link: https://doi.org/10.1108/..
 
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4

Study of the Effects Related to the Electric Reverse Stress..:

Abdullah, K Al ; Alloush, Faisal Al ; Jaafar, Ali.
Energy Procedia.  36 (2013)  - p. 104-113 , 2013
Link: https://doi.org/10.1016/..
 
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5

Low Frequency and Low Temperature Behavior of Si, Solar Cel..:

Abdullah, K. Al ; Alloush, Faisal Al ; Termanini, M.J..
Energy Procedia.  19 (2012)  - p. 183-191 , 2012
Link: https://doi.org/10.1016/..
 
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6

Comparison of Two Common Maximum Power Point Trackers by Si..:

Zegaoui, A. ; Aillerie, M. ; Petit, P....
Energy Procedia.  6 (2011)  - p. 678-687 , 2011
Link: https://doi.org/10.1016/..
 
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7

Detection of traps induced and activated by high field stre..:

Abboud, N. ; Cuminal, Y. ; Foucaran, A..
Microelectronic Engineering.  88 (2011)  11 - p. 3333-3337 , 2011
Link: https://doi.org/10.1016/..
 
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8

The effect of reverse current on the dark properties of pho..:

Sidawi, J. ; Habchi, R. ; Abboud, N....
Energy Procedia.  6 (2011)  - p. 743-749 , 2011
Link: https://doi.org/10.1016/..
 
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9

Evaluation of the electrical properties under extreme stres..:

Sidawi, J. ; Abboud, N. ; Jelian, G...
Microelectronics International.  28 (2011)  1 - p. 12-16 , 2011
Link: https://doi.org/10.1108/..
 
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10

VDMOSFET reliability dependence on the integrated drain‐sou..:

El Bitar, R. ; Habchi, R. ; Salame, C....
Microelectronics International.  26 (2009)  1 - p. 33-36 , 2009
Link: https://doi.org/10.1108/..
 
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11

Switching times variation of MOSFET devices with temperatur..:

Habchi, R. ; Salame, C. ; El Bitar, R..
Microelectronics Journal.  39 (2008)  5 - p. 828-831 , 2008
Link: https://doi.org/10.1016/..
 
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12

Switching times variation of power MOSFET devices after ele..:

Habchi, R. ; Salame, C. ; Mialhe, P..
Microelectronics Reliability.  47 (2007)  8 - p. 1296-1299 , 2007
Link: https://doi.org/10.1016/..
 
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13

Silicon MOSFET devices electrical parameters evolution at h..:

Salame, C. ; Habchi, R.
Microelectronics International.  25 (2007)  1 - p. 21-24 , 2007
Link: https://doi.org/10.1108/..
 
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14

Hot carrier injection in VDMOSFET for improvement of commut..:

El Bitar, R. ; Salame, C. ; Mialhe, P.
Microelectronics International.  24 (2007)  3 - p. 60-65 , 2007
Link: https://doi.org/10.1108/..
 
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15

Temperature dependence of a silicon power device switching ..:

Habchi, R. ; Salame, C. ; Khoury, A..
Applied Physics Letters.  88 (2006)  15 - p. , 2006
Link: https://doi.org/10.1063/..
 
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