Sanz Alcaine, José Miguel
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1

Experimental Characterization of Dynamic COSS Losses in 600..:

, In: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC),
 
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4

Loss Measurement of Low RDS Devices Through Thermal Modelli..:

, In: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe),
 
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5

Experimental verification of the AC resistance effect in In..:

, In: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe),
Aizpuru, Iosu ; Lajas, Miguel ; Arruti, Asier... - p. 1-8 , 2023
 
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