E-LIB Suche - Ergebnisse für: Saugnon, D.

1

Impact of RF stress on different topologies of 100 nm X-ban..:

Pinault, B. ; Tartarin, J.G. ; Saugnon, D..
Microelectronics Reliability. 150 (2023) - p. 115126 , 2023

Link: https://doi.org/10.1016/..

2

Gate defects analysis in AlGaN/GaN devices by mean of accur..:

Tartarin, J.G. ; Lazar, O. ; Saugnon, D....
Microelectronics Reliability. 76-77 (2017) - p. 344-349 , 2017

Link: https://doi.org/10.1016/..

3

Original Design Procedure For Self-Reconfigurable Low Noise..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),

Tartarin, Jean-Guy ; Pinault, Bastien ; Saugnon, Damien - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

4

A Self-Reconfigurable Highly Linear and Robust X-Band MMIC ..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),

Pinault, Bastien ; Tartarin, Jean-Guy ; Saugnon, Damien. - p. 13-16 , 2023

Link: https://doi.org/10.23919..

5

Impact of RF stress on different topologies of 100 nm X-ban..:

Pinault, B ; Tartarin, Jean-Guy ; Saugnon, D.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2023.115126. , 2023

Link: https://hal.science/hal-..

6

Impact of RF stress on different topologies of 100 nm X-ban..:

Pinault, B ; Tartarin, Jean-Guy ; Saugnon, D.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2023.115126. , 2023

Link: https://hal.science/hal-..

7

Original Design Procedure For Self-Reconfigurable Low Noise..:

Tartarin, Jean-Guy ; Pinault, Bastien ; Saugnon, Damien
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICNF57520.2023.10472740. , 2023

Link: https://hal.science/hal-..

8

A Self-Reconfigurable Highly Linear and Robust X-Band MMIC ..:

Pinault, Bastien ; Tartarin, Jean-Guy ; Saugnon, Damien.
info:eu-repo/semantics/altIdentifier/doi/10.23919/EuMIC58042.2023.10288807. , 2023

Link: https://hal.science/hal-..

9

A Self-Reconfigurable Highly Linear and Robust X-Band MMIC ..:

Pinault, Bastien ; Tartarin, Jean-Guy ; Saugnon, Damien.
info:eu-repo/semantics/altIdentifier/doi/10.23919/EuMIC58042.2023.10288807. , 2023

Link: https://hal.science/hal-..

10

A new Method for Designing Robust Low Noise Amplifier ; Nou..:

Bastien, Pinault ; Tartarin, Jean-Guy ; Saugnon, Damien.
hal-04142799. , 2023

Link: https://hal.science/hal-..

11

Original Design Procedure For Self-Reconfigurable Low Noise..:

Tartarin, Jean-Guy ; Pinault, Bastien ; Saugnon, Damien
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICNF57520.2023.10472740. , 2023

Link: https://hal.science/hal-..

12

A new Method for Designing Robust Low Noise Amplifier ; Nou..:

Bastien, Pinault ; Tartarin, Jean-Guy ; Saugnon, Damien.
hal-04142799. , 2023

Link: https://hal.science/hal-..

13

A new Method for Designing Robust Low Noise Amplifier ; Nou..:

Bastien, Pinault ; Tartarin, Jean-Guy ; Saugnon, Damien.
hal-04142799. , 2023

Link: https://hal.science/hal-..

14

Secured Failure Analysis Methodology for Accurate Diagnosti..:

Tartarin, Jean-Guy ; Saugnon, Damien ; Bary, Laurent.
hal-02086969. , 2019

Link: https://hal.science/hal-..

15

Secured Failure Analysis Methodology for Accurate Diagnosti..:

Tartarin, Jean-Guy ; Saugnon, Damien ; Bary, Laurent.
hal-02086969. , 2019

Link: https://hal.science/hal-..