E-LIB Suche - Ergebnisse für: Sayil, Selahattin

1

Online Electrical Engineering Labs with Collaborative Open-..:

, In: 2023 IEEE Frontiers in Education Conference (FIE),

Sayil, Selahattin ; Tcheslavski, Gleb ; Yoo, Julia. - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

2

Creating Engaged and Active Learning Through Collaborative ..:

, In: 2022 IEEE Frontiers in Education Conference (FIE),

Sayil, Selahattin ; Yoo, Julia ; Tcheslavski, Gleb - p. 1-5 , 2022

Link: https://doi.org/10.1109/..

3

Mitigating soft errors in NCL circuits using a transmission..:

Lamichhane, Subed ; Wang, Yuyao ; Sayil, Selahattin
Analog Integrated Circuits and Signal Processing. 115 (2022) 1 - p. 101-109 , 2022

Link: https://doi.org/10.1007/..

4

Coupling Noise Mitigation using a Pass Transistor:

, In: 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI),

Sayil, Selahattin ; Lamichhane, Subed ; Sayil, Kutay - p. 358-362 , 2020

Link: https://doi.org/10.1109/..

5

Crosstalk noise mitigation using a transmission gate with v..:

Sayil, Selahattin ; Lamichhane, Subed ; Sayil, Kutay
Analog Integrated Circuits and Signal Processing. 105 (2020) 2 - p. 183-190 , 2020

Link: https://doi.org/10.1007/..

6

Contactless VLSI Measurement and Testing Techniques

SpringerLink, Bücher

Sayil, Selahattin , 2018

Link: http://suub-bremen.ciand..

7

A survey of circuit-level soft error mitigation methodologi..:

Sayil, Selahattin
Analog Integrated Circuits and Signal Processing. 99 (2018) 1 - p. 63-70 , 2018

Link: https://doi.org/10.1007/..

8

Mitigating the thermally induced single event crosstalk:

Sayil, Selahattin ; Bhowmik, Pankaj
Analog Integrated Circuits and Signal Processing. 92 (2017) 2 - p. 247-253 , 2017

Link: https://doi.org/10.1007/..

9

Modeling single event crosstalk speedup in nanometer techno..:

Sayil, Selahattin ; Yuan, Li
Microelectronics Journal. 46 (2015) 5 - p. 343-350 , 2015

Link: https://doi.org/10.1016/..

10

Single event coupling delay estimation in nanometer technol..:

Sayil, Selahattin ; Yao, Yao
Analog Integrated Circuits and Signal Processing. 86 (2015) 2 - p. 215-225 , 2015

Link: https://doi.org/10.1007/..

11

Single-Event Coupling Soft Errors in Nanoscale CMOS Circuit:

Sayil, Selahattin ; Yeddula, Sumanth R. ; Juyu Wang
IEEE Design & Test. 30 (2013) 6 - p. 89-97 , 2013

Link: https://doi.org/10.1109/..

12

Coupling induced soft error mechanisms in nanoscale CMOS te..:

Sayil, Selahattin ; Wang, Juyu
Analog Integrated Circuits and Signal Processing. 79 (2013) 1 - p. 115-126 , 2013

Link: https://doi.org/10.1007/..

13

Single event crosstalk prediction in nanometer technologies:

Sayil, Selahattin ; Boorla, Vijay K.
Analog Integrated Circuits and Signal Processing. 72 (2011) 1 - p. 205-214 , 2011

Link: https://doi.org/10.1007/..

14

Modeling Single Event Crosstalk in Nanometer Technologies:

Sayil, Selahattin ; Boorla, Vijay K. ; Yeddula, Sumanth R.
IEEE Transactions on Nuclear Science. 58 (2011) 5 - p. 2493-2502 , 2011

Link: https://doi.org/10.1109/..

15

Modeling single event crosstalk in nanometer technologies:

, In: 2011 7th International Conference on Electrical and Electronics Engineering (ELECO),

Sayil, Selahattin ; Boorla, Vijay K. - p. II-115-II-119 , 2011

Link: https://doi.org/10.1109/..