E-LIB Suche - Ergebnisse für: Schöpke, A

1

Paul Dessau

Arts & Culture;Culture & Society

Cohn-Vossen, Richard ; Schöpke, A ; Bachnick, Klaus... , 2019

Link: http://www.socialismonfi..

2

Comprehensive Comparison of Various Techniques for the Anal..:

Abou-Ras, D. ; Caballero, R. ; Fischer, C.-H....
Microscopy and Microanalysis. 17 (2011) 5 - p. 728-751 , 2011

Link: https://doi.org/10.1017/..

3

Compositional analysis of thin SiOxNy:H films by heavy-ion ..:

Bohne, W ; Röhrich, J ; Schöpke, A...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 217 (2004) 2 - p. 237-245 , 2004

Link: https://doi.org/10.1016/..

4

Excimer laser crystallization of amorphous silicon on metal..:

Brendel, K. ; Nickel, N.H. ; Lengsfeld, P....
Thin Solid Films. 427 (2003) 1-2 - p. 86-90 , 2003

Link: https://doi.org/10.1016/..

5

Crystalline silicon films sputtered on molybdenum:

Reinig, P ; Fenske, F ; Fuhs, W..
Applied Surface Science. 210 (2003) 3-4 - p. 301-306 , 2003

Link: https://doi.org/10.1016/..

6

Solid-phase epitaxy of CaSi2 on Si(111) and the Schottky-ba..:

Würz, R. ; Schmidt, M. ; Schöpke, A..
Applied Surface Science. 190 (2002) 1-4 - p. 437-440 , 2002

Link: https://doi.org/10.1016/..

7

Epitaxial growth of CaSi2 on Si(111):

Schöpke, A. ; Würz, R. ; Schmidt, M.
Surface and Interface Analysis. 34 (2002) 1 - p. 464-467 , 2002

Link: https://doi.org/10.1002/..

8

Excimer laser crystallization of amorphous silicon on molyb..:

Brendel, K. ; Lengsfeld, P. ; Sieber, I....
Journal of Applied Physics. 91 (2002) 5 - p. 2969-2973 , 2002

Link: https://doi.org/10.1063/..

9

Triterpenoid saponins of Bellis perennis:

Glensk, M. ; Wray, V. ; Nimtz, M..
Scientia Pharmaceutica. 69 (2001) 1 - p. 69-73 , 2001

Link: https://doi.org/10.3797/..

10

Composition and morphology studies of ultrathin CaF2 epitax..:

Bohne, W ; Röhrich, J ; Schmidt, M...
Applied Surface Science. 179 (2001) 1-4 - p. 73-78 , 2001

Link: https://doi.org/10.1016/..

11

Analysis of Co and Cr dopants in epitaxial films of β-FeSi ..:

Bohne, W. ; Reinsperger, G.-U. ; Röhrich, J....
Fresenius' Journal of Analytical Chemistry. 365 (1999) 1-3 - p. 258-262 , 1999

Link: https://doi.org/10.1007/..

12

Transparent conductive ZnO:Al films by reactive co-sputteri..:

Fenske, F. ; Fuhs, W. ; Nebauer, E....
Thin Solid Films. 343-344 (1999) - p. 130-133 , 1999

Link: https://doi.org/10.1016/..

13

Refined Approach to PCA-assisted Auger Depth Profile Analys..:

Schöpke, A. ; Kelling, S.
Surface and Interface Analysis. 25 (1997) 1 - p. 5-9 , 1997

Link: https://doi.org/10.1002/..

14

Characterization of the stoichiometry of coevaporated FeSi ..:

Schöpke, A. ; Selle, B. ; Sieber, I....
Fresenius' Journal of Analytical Chemistry. 358 (1997) 1-2 - p. 322-325 , 1997

Link: https://doi.org/10.1007/..

15

Analytical studies of nickel silicide formation through a t..:

Fenske, F. ; Schöpke, A. ; Schulze, S..
Applied Surface Science. 104-105 (1996) - p. 218-222 , 1996

Link: https://doi.org/10.1016/..