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Schülli, T.U.
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1

Dynamic and controlled stretching of macroscopic crystallin..:

Schülli, T.U. ; Dollekamp, E ; Ismaili, Z...
Materials Today Advances.  22 (2024)  - p. 100489 , 2024
Link: https://doi.org/10.1016/..
 
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2

Energy and Environmental Science at ESRF:

Longo,, A. ; Sahle,, Ch. J. ; Glatzel,, P....
Synchrotron Radiation News.  33 (2020)  5 - p. 40-51 , 2020
Link: https://doi.org/10.1080/..
 
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3

Multi-wavelength Bragg coherent X-ray diffraction imaging o..:

Lauraux, F. ; Cornelius, T. W. ; Labat, S....
Journal of Applied Crystallography.  53 (2020)  1 - p. 170-177 , 2020
Link: https://doi.org/10.1107/..
 
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Modified strain and elastic energy behavior of Ge islands f..:

Marçal, L.A.B. ; Richard, M.-I. ; Persichetti, L....
Applied Surface Science.  466 (2019)  - p. 801-807 , 2019
Link: https://doi.org/10.1016/..
 
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5

X-ray zoom lens allows for energy scans in X-ray microscopy:

Kornemann, E. ; Zhou, T. ; Márkus, O....
Optics Express.  27 (2019)  1 - p. 185 , 2019
Link: https://doi.org/10.1364/..
 
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6

Temperature evolution of defects and atomic ordering in Si1..:

Richard, M.-I. ; Malachias, A. ; Stoffel, M....
Journal of Applied Physics.  119 (2016)  8 - p. , 2016
Link: https://doi.org/10.1063/..
 
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7

Microstrain distributions in polycrystalline thin films mea..:

Schäfer, N. ; Chahine, G. A. ; Wilkinson, A. J....
Journal of Applied Crystallography.  49 (2016)  2 - p. 632-635 , 2016
Link: https://doi.org/10.1107/..
 
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8

Direct evidence of strain transfer for InAs island growth o..:

Marçal, L. A. B. ; Richard, M.-I. ; Magalhães-Paniago, R....
Applied Physics Letters.  106 (2015)  15 - p. , 2015
Link: https://doi.org/10.1063/..
 
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9

Formation, stability, and atomic structure of theSi(111)−(6..:

Daudin, R. ; Nogaret, T. ; Vaysset, A....
Physical Review B.  91 (2015)  16 - p. , 2015
Link: https://doi.org/10.1103/..
 
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10

Ordered domain lateral location, symmetry, and thermal stab..:

Richard, M.-I. ; Malachias, A. ; Schülli, T. U....
Applied Physics Letters.  106 (2015)  1 - p. , 2015
Link: https://doi.org/10.1063/..
 
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11

Strain and lattice orientation distribution in SiN/Ge compl..:

Chahine, G. A. ; Zoellner, M. H. ; Richard, M.-I....
Applied Physics Letters.  106 (2015)  7 - p. , 2015
Link: https://doi.org/10.1063/..
 
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12

Full-field X-ray diffraction microscopy using polymeric com..:

Hilhorst, J. ; Marschall, F. ; Tran Thi, T. N...
Journal of Applied Crystallography.  47 (2014)  6 - p. 1882-1888 , 2014
Link: https://doi.org/10.1107/..
 
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13

Fully coherent growth of Ge on free-standing Si(001) nanome..:

Montalenti, F. ; Salvalaglio, M. ; Marzegalli, A....
Physical Review B.  89 (2014)  1 - p. , 2014
Link: https://doi.org/10.1103/..
 
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14

Compact ultrahigh vacuum sample environments for x-ray nano..:

Evans, P. G. ; Chahine, G. ; Grifone, R....
Review of Scientific Instruments.  84 (2013)  11 - p. , 2013
Link: https://doi.org/10.1063/..
 
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15

Epitaxial orientation changes in a dewetting gold film on S..:

Daudin, R. ; Nogaret, T. ; Schülli, T. U....
Physical Review B.  86 (2012)  9 - p. , 2012
Link: https://doi.org/10.1103/..
 
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