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Schülli, T.U.
153
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Online (153)
Mediatypes
Articles (Online) (130)
OpenAccess-fulltext (23)
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1
Dynamic and controlled stretching of macroscopic crystallin..:
Schülli, T.U.
;
Dollekamp, E
;
Ismaili, Z
...
Materials Today Advances. 22 (2024) - p. 100489 , 2024
Link:
https://doi.org/10.1016/..
?
2
Energy and Environmental Science at ESRF:
Longo,, A.
;
Sahle,, Ch. J.
;
Glatzel,, P.
...
Synchrotron Radiation News. 33 (2020) 5 - p. 40-51 , 2020
Link:
https://doi.org/10.1080/..
?
3
Multi-wavelength Bragg coherent X-ray diffraction imaging o..:
Lauraux, F.
;
Cornelius, T. W.
;
Labat, S.
...
Journal of Applied Crystallography. 53 (2020) 1 - p. 170-177 , 2020
Link:
https://doi.org/10.1107/..
?
4
Modified strain and elastic energy behavior of Ge islands f..:
Marçal, L.A.B.
;
Richard, M.-I.
;
Persichetti, L.
...
Applied Surface Science. 466 (2019) - p. 801-807 , 2019
Link:
https://doi.org/10.1016/..
?
5
X-ray zoom lens allows for energy scans in X-ray microscopy:
Kornemann, E.
;
Zhou, T.
;
Márkus, O.
...
Optics Express. 27 (2019) 1 - p. 185 , 2019
Link:
https://doi.org/10.1364/..
?
6
Temperature evolution of defects and atomic ordering in Si1..:
Richard, M.-I.
;
Malachias, A.
;
Stoffel, M.
...
Journal of Applied Physics. 119 (2016) 8 - p. , 2016
Link:
https://doi.org/10.1063/..
?
7
Microstrain distributions in polycrystalline thin films mea..:
Schäfer, N.
;
Chahine, G. A.
;
Wilkinson, A. J.
...
Journal of Applied Crystallography. 49 (2016) 2 - p. 632-635 , 2016
Link:
https://doi.org/10.1107/..
?
8
Direct evidence of strain transfer for InAs island growth o..:
Marçal, L. A. B.
;
Richard, M.-I.
;
Magalhães-Paniago, R.
...
Applied Physics Letters. 106 (2015) 15 - p. , 2015
Link:
https://doi.org/10.1063/..
?
9
Formation, stability, and atomic structure of theSi(111)−(6..:
Daudin, R.
;
Nogaret, T.
;
Vaysset, A.
...
Physical Review B. 91 (2015) 16 - p. , 2015
Link:
https://doi.org/10.1103/..
?
10
Ordered domain lateral location, symmetry, and thermal stab..:
Richard, M.-I.
;
Malachias, A.
;
Schülli, T. U.
...
Applied Physics Letters. 106 (2015) 1 - p. , 2015
Link:
https://doi.org/10.1063/..
?
11
Strain and lattice orientation distribution in SiN/Ge compl..:
Chahine, G. A.
;
Zoellner, M. H.
;
Richard, M.-I.
...
Applied Physics Letters. 106 (2015) 7 - p. , 2015
Link:
https://doi.org/10.1063/..
?
12
Full-field X-ray diffraction microscopy using polymeric com..:
Hilhorst, J.
;
Marschall, F.
;
Tran Thi, T. N.
..
Journal of Applied Crystallography. 47 (2014) 6 - p. 1882-1888 , 2014
Link:
https://doi.org/10.1107/..
?
13
Fully coherent growth of Ge on free-standing Si(001) nanome..:
Montalenti, F.
;
Salvalaglio, M.
;
Marzegalli, A.
...
Physical Review B. 89 (2014) 1 - p. , 2014
Link:
https://doi.org/10.1103/..
?
14
Compact ultrahigh vacuum sample environments for x-ray nano..:
Evans, P. G.
;
Chahine, G.
;
Grifone, R.
...
Review of Scientific Instruments. 84 (2013) 11 - p. , 2013
Link:
https://doi.org/10.1063/..
?
15
Epitaxial orientation changes in a dewetting gold film on S..:
Daudin, R.
;
Nogaret, T.
;
Schülli, T. U.
...
Physical Review B. 86 (2012) 9 - p. , 2012
Link:
https://doi.org/10.1103/..
1-15