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Schemerov, Ivan V.
12
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Format
Online (12)
Mediatypes
Articles (Online) (9)
OpenAccess-fulltext (3)
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1
Direct Observation of the Stretching of the Photoinduced Cu..:
Schemerov, Ivan V.
;
Polyakov, Alexander Y.
;
Vasilev, Anton A.
...
ECS Journal of Solid State Science and Technology. 12 (2023) 12 - p. 125004 , 2023
Link:
https://doi.org/10.1149/..
?
2
Contact and contactless porous silicon parameter measuremen..:
Latukhina, Natalya V.
;
Kobeleva, Svetlana P.
;
Rogozhina, G. A.
..
Modern Electronic Materials. 4 (2018) 4 - p. 143-150 , 2018
Link:
https://doi.org/10.3897/..
?
3
Contact and contactless porous silicon parameter measuremen..:
Latukhina, Natalya V
;
Kobeleva, Svetlana P
;
Rogozhina, G. A
..
https://zenodo.org/record/3556117. , 2018
Link:
https://zenodo.org/recor..
?
4
Contact and contactless porous silicon parameter measuremen..:
Latukhina, Natalya V
;
Kobeleva, Svetlana P
;
Rogozhina, G. A
..
info:eu-repo/semantics/altIdentifier/eissn/2452-1779. , 2018
Link:
https://doi.org/10.3897/..
?
5
Contact and contactless porous silicon parameter measuremen..:
Natalya V. Latukhina
;
Svetlana P. Kobeleva
;
G. A. Rogozhina
..
https://moem.pensoft.net/article/39503/download/pdf/. , 2018
Link:
https://doi.org/10.3897/..
?
6
Trap States and Carrier Diffusion in Czochralski (100) Sing..:
Nikolaev, V. I.
;
Polyakov, A. Y.
;
Krymov, V. M.
...
ECS Journal of Solid State Science and Technology. 13 (2024) 1 - p. 015003 , 2024
Link:
https://doi.org/10.1149/..
?
7
Study of the Abnormally High Photocurrent Relaxation Time i..:
Schemerov, I. V.
;
Polyakov, A. Yu.
;
Almaev, A. V.
...
Russian Microelectronics. 52 (2023) 8 - p. 827-834 , 2023
Link:
https://doi.org/10.1134/..
?
8
Electrical Properties, Deep Levels and Luminescence Related..:
Polyakov, A. Y.
;
Smirnov, N. B.
;
Schemerov, I. V.
...
ECS Journal of Solid State Science and Technology. 8 (2019) 7 - p. Q3091-Q3096 , 2019
Link:
https://doi.org/10.1149/..
?
9
On using photoconductivity decay to determine Si free carri..:
Anfimov, I M
;
Anfimov, M V
;
Egorov, D S
...
IOP Conference Series: Materials Science and Engineering. 474 (2019) - p. 012011 , 2019
Link:
https://doi.org/10.1088/..
?
10
Deep traps and persistent photocapacitance in β-(Al0.14 Ga0..:
Polyakov, A. Y.
;
Smirnov, N. B.
;
Schemerov, I. V.
...
Journal of Applied Physics. 125 (2019) 9 - p. , 2019
Link:
https://doi.org/10.1063/..
?
11
On the Problem of Determining the Bulk Lifetime by Photocon..:
Anfimov, I. M.
;
Kobeleva, S. P.
;
Pylnev, A. V.
...
Russian Microelectronics. 46 (2017) 8 - p. 585-590 , 2017
Link:
https://doi.org/10.1134/..
?
12
A device for free-carrier recombination lifetime measuremen..:
Kobeleva, S. P.
;
Anfimov, I. M.
;
Schemerov, I. V.
Instruments and Experimental Techniques. 59 (2016) 3 - p. 420-424 , 2016
Link:
https://doi.org/10.1134/..
1-12
