Scherrer, Barbara
141  results:
Search for persons X
?
2

Reliability test for subsea power semiconductors:

Guillon, David ; Scherrer, Barbara ; Dugal, Franc..
Microelectronics Reliability.  114 (2020)  - p. 113771 , 2020
 
?
 
?
 
?
6

Heteroepitaxial hematite photoanodes as a model system for ..:

Grave, Daniel A. ; Dotan, Hen ; Levy, Yossi...
Journal of Materials Chemistry A.  4 (2016)  8 - p. 3052-3060 , 2016
 
?
 
?
 
?
 
?
 
1-15