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Schmitz, Jurriaan
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1

Reliability Investigations of MOSFETs using RF Small Signal..:

Chohan, Talha , 2023
Link: https://nbn-resolving.de..
 
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2

Thermal Resistivity of FFF Printed Carbon Black Doped Polym..:

, In: 2023 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS),
Jonkers, Heime ; Kosmas, Dimitrios ; Schmitz, Jurriaan. - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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3

In‐depth analysis of potential‐induced degradation in a com..:

Yilmaz, Pelin ; de Wild, Jessica ; Aninat, Rémi...
Progress in Photovoltaics: Research and Applications.  31 (2023)  6 - p. 627-636 , 2023
Link: https://doi.org/10.1002/..
 
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4

Characterisation of Photodiodes in 22 nm FDSOI at 850 nm:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Bakker, Jelle H. T. ; Alink, Mark S. Oude ; Schmitz, Jurriaan. - p. 65-68 , 2023
Link: https://doi.org/10.1109/..
 
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5

Corrigendum to "Inaccuracies in contact resistivity from th..:

van Wijngaarden, Bas ; Yang, Junchun ; Schmitz, Jurriaan
Solar Energy Materials and Solar Cells.  254 (2023)  - p. 112254 , 2023
Link: https://doi.org/10.1016/..
 
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6

Potential induced degradation of CIGS PV systems: A literat..:

Yilmaz, Pelin ; Schmitz, Jurriaan ; Theelen, Mirjam
Renewable and Sustainable Energy Reviews.  154 (2022)  - p. 111819 , 2022
Link: https://doi.org/10.1016/..
 
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7

Post‐mortem analysis of a commercial Copper Indium Gallium ..:

Yilmaz, Pelin ; Aninat, Rémi ; Cruz, Gonzalo Ott...
Progress in Photovoltaics: Research and Applications.  30 (2022)  6 - p. 640-647 , 2022
Link: https://doi.org/10.1002/..
 
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8

Inaccuracies in contact resistivity from the Cox–Strack met..:

van Wijngaarden, Bas ; Yang, Junchun ; Schmitz, Jurriaan
Solar Energy Materials and Solar Cells.  246 (2022)  - p. 111909 , 2022
Link: https://doi.org/10.1016/..
 
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9

Review of technology specific degradation in crystalline si..:

Kettle, Jeff ; Aghaei, Mohammadreza ; Ahmad, Shahzada...
Progress in Photovoltaics: Research and Applications.  30 (2022)  12 - p. 1365-1392 , 2022
Link: https://doi.org/10.1002/..
 
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10

Interface States Characterization of UTB SOI MOSFETs From t..:

Vermeer, Matthias L. ; Hueting, Raymond J. E. ; Pirro, Luca..
IEEE Transactions on Electron Devices.  68 (2021)  2 - p. 497-502 , 2021
Link: https://doi.org/10.1109/..
 
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11

Conduction and Electric Field Effect in Ultra-Thin Tungsten..:

van der Zouw, Kees ; Aarnink, Antonius A. I. ; Schmitz, Jurriaan.
IEEE Transactions on Semiconductor Manufacturing.  33 (2020)  2 - p. 202-209 , 2020
Link: https://doi.org/10.1109/..
 
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12

On the Accuracy of the Cox–Strack Equation and Method for C..:

van Rijnbach, Milou ; Hueting, Raymond J. E. ; Stodolny, Maciej...
IEEE Transactions on Electron Devices.  67 (2020)  4 - p. 1757-1763 , 2020
Link: https://doi.org/10.1109/..
 
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13

Effect of Ambient on the Recovery of Hot-Carrier Degraded D..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
de Jong, Maurits J. ; Salm, Cora ; Schmitz, Jurriaan - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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14

Anomalous Scaling of Parasitic Capacitance in FETs with a H..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
Smink, Alexander E.M. ; de Jong, Maurits J. ; Hilgenkamp, Hans.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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15

Planar Electrostatically Doped Reconfigurable Schottky Barr..:

Krauss, Tillmann Adrian , 2019
Link: https://nbn-resolving.de..
 
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