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Schuermeyer, Fritz L.
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1
Photoemission studies on heterostructure bipolar transistor:
Schuermeyer, Fritz
;
Zampardi, Peter J
;
Asbeck, Peter M
Solid-State Electronics. 43 (1999) 8 - p. 1555-1560 , 1999
Link:
https://doi.org/10.1016/..
?
2
Charge Storage Effects in Pseudomorphic High Electron Mobil..:
Schuermeyer, Fritz
;
Cerny, Charles
;
Bozada, Chris
..
Japanese Journal of Applied Physics. 36 (1997) 3S - p. 1330 , 1997
Link:
https://doi.org/10.1143/..
?
3
Characterization of fully fabricated PHEMTs using photoelec..:
Schuermeyer, Fritz
Solid-State Electronics. 41 (1997) 10 - p. 1529-1533 , 1997
Link:
https://doi.org/10.1016/..
?
4
Photoelectric emission and conductance studies on fully fab..:
Schuermeyer, Fritz
;
Cerny, Charles
;
Loehr, J.P
.
Solid-State Electronics. 38 (1995) 9 - p. 1615-1618 , 1995
Link:
https://doi.org/10.1016/..
?
5
Monte Carlo simulation of bulk hole transport in AlxGa1−xAs..:
Martinez, Marino J.
;
Look, David C.
;
Sizelove, John R.
.
Journal of Applied Physics. 77 (1995) 2 - p. 661-664 , 1995
Link:
https://doi.org/10.1063/..
?
6
Gate currents in heterostructure field-effect transistors: ..:
Schuermeyer, Fritz
;
Shur, Michael
;
Martinez, Edgar
.
Materials Science and Engineering: B. 28 (1994) 1-3 - p. 264-267 , 1994
Link:
https://doi.org/10.1016/..
?
7
Band-edge alignment in heterostructures:
Schuermeyer, Fritz L.
;
Cook, Paul
;
Martinez, Edgar
.
Applied Physics Letters. 55 (1989) 18 - p. 1877-1878 , 1989
Link:
https://doi.org/10.1063/..
?
8
Back bias effects on two-dimensional electron gas:
Schuermeyer, Fritz L.
;
Grzyb, Joseph A.
;
Curtis, Michael J.
..
Journal of Applied Physics. 63 (1988) 4 - p. 1121-1125 , 1988
Link:
https://doi.org/10.1063/..
?
9
Electrical analysis methods for metal insulator semiconduct..:
Schuermeyer, Fritz L.
;
Hartnagel, Hans L.
Journal of Applied Physics. 51 (1980) 12 - p. 6279-6285 , 1980
Link:
https://doi.org/10.1063/..
?
10
Endurance studies on MNOS devices:
Schuermeyer, Fritz L.
;
Young, Charles R.
Journal of Applied Physics. 49 (1978) 8 - p. 4556-4559 , 1978
Link:
https://doi.org/10.1063/..
?
11
Self-Induced Sputtering during Electron-Beam Evaporation of..:
Schuermeyer, Fritz L.
;
Chase, Wayne R.
;
King, Emerson L.
Journal of Applied Physics. 42 (1971) 13 - p. 5856-5859 , 1971
Link:
https://doi.org/10.1063/..
?
12
Monte Carlo Calculations of Internal Photoemission Yields i..:
Schuermeyer, Fritz L.
;
Young, Charles R.
;
Blasingame, John M.
Journal of Applied Physics. 39 (1968) 3 - p. 1791-1796 , 1968
Link:
https://doi.org/10.1063/..
?
13
INTERPRETATION OF LOW-VOLTAGE PHOTOMEASUREMENTS IN METAL-IN..:
Schuermeyer, Fritz L.
;
Crawford, Julian A.
Applied Physics Letters. 9 (1966) 8 - p. 317-319 , 1966
Link:
https://doi.org/10.1063/..
?
14
Photovoltage Measurements on an Al-Al2O3-Al Thin-Film Sandw..:
Schuermeyer, Fritz L.
Journal of Applied Physics. 37 (1966) 5 - p. 1998-2001 , 1966
Link:
https://doi.org/10.1063/..
1-14