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Schuermeyer, Fritz L.
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1

Photoemission studies on heterostructure bipolar transistor:

Schuermeyer, Fritz ; Zampardi, Peter J ; Asbeck, Peter M
Solid-State Electronics.  43 (1999)  8 - p. 1555-1560 , 1999
Link: https://doi.org/10.1016/..
 
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2

Charge Storage Effects in Pseudomorphic High Electron Mobil..:

Schuermeyer, Fritz ; Cerny, Charles ; Bozada, Chris..
Japanese Journal of Applied Physics.  36 (1997)  3S - p. 1330 , 1997
Link: https://doi.org/10.1143/..
 
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3

Characterization of fully fabricated PHEMTs using photoelec..:

Schuermeyer, Fritz
Solid-State Electronics.  41 (1997)  10 - p. 1529-1533 , 1997
Link: https://doi.org/10.1016/..
 
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4

Photoelectric emission and conductance studies on fully fab..:

Schuermeyer, Fritz ; Cerny, Charles ; Loehr, J.P.
Solid-State Electronics.  38 (1995)  9 - p. 1615-1618 , 1995
Link: https://doi.org/10.1016/..
 
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5

Monte Carlo simulation of bulk hole transport in AlxGa1−xAs..:

Martinez, Marino J. ; Look, David C. ; Sizelove, John R..
Journal of Applied Physics.  77 (1995)  2 - p. 661-664 , 1995
Link: https://doi.org/10.1063/..
 
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6

Gate currents in heterostructure field-effect transistors: ..:

Schuermeyer, Fritz ; Shur, Michael ; Martinez, Edgar.
Materials Science and Engineering: B.  28 (1994)  1-3 - p. 264-267 , 1994
Link: https://doi.org/10.1016/..
 
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7

Band-edge alignment in heterostructures:

Schuermeyer, Fritz L. ; Cook, Paul ; Martinez, Edgar.
Applied Physics Letters.  55 (1989)  18 - p. 1877-1878 , 1989
Link: https://doi.org/10.1063/..
 
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8

Back bias effects on two-dimensional electron gas:

Schuermeyer, Fritz L. ; Grzyb, Joseph A. ; Curtis, Michael J...
Journal of Applied Physics.  63 (1988)  4 - p. 1121-1125 , 1988
Link: https://doi.org/10.1063/..
 
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9

Electrical analysis methods for metal insulator semiconduct..:

Schuermeyer, Fritz L. ; Hartnagel, Hans L.
Journal of Applied Physics.  51 (1980)  12 - p. 6279-6285 , 1980
Link: https://doi.org/10.1063/..
 
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10

Endurance studies on MNOS devices:

Schuermeyer, Fritz L. ; Young, Charles R.
Journal of Applied Physics.  49 (1978)  8 - p. 4556-4559 , 1978
Link: https://doi.org/10.1063/..
 
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11

Self-Induced Sputtering during Electron-Beam Evaporation of..:

Schuermeyer, Fritz L. ; Chase, Wayne R. ; King, Emerson L.
Journal of Applied Physics.  42 (1971)  13 - p. 5856-5859 , 1971
Link: https://doi.org/10.1063/..
 
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12

Monte Carlo Calculations of Internal Photoemission Yields i..:

Schuermeyer, Fritz L. ; Young, Charles R. ; Blasingame, John M.
Journal of Applied Physics.  39 (1968)  3 - p. 1791-1796 , 1968
Link: https://doi.org/10.1063/..
 
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13

INTERPRETATION OF LOW-VOLTAGE PHOTOMEASUREMENTS IN METAL-IN..:

Schuermeyer, Fritz L. ; Crawford, Julian A.
Applied Physics Letters.  9 (1966)  8 - p. 317-319 , 1966
Link: https://doi.org/10.1063/..
 
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14

Photovoltage Measurements on an Al-Al2O3-Al Thin-Film Sandw..:

Schuermeyer, Fritz L.
Journal of Applied Physics.  37 (1966)  5 - p. 1998-2001 , 1966
Link: https://doi.org/10.1063/..
 
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