I agree that this site is using cookies. You can find further informations here.
X
Schvittz, Rafael B.
14  results:
Search for persons X
?
1

Impact on Radiation Robustness of Gate Mapping in FinFET Ci..:

, In: 2023 IEEE International Symposium on Circuits and Systems (ISCAS),
Sandoval, Bernardo Borges ; Brendler, Leonardo H. ; Kastensmidt, Fernanda L.... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
?
2

Evaluating the Reliability of Different Voting Schemes for ..:

Balen, Tiago R. ; González, Carlos J. ; Oliveira, Ingrid F. V....
Journal of Electronic Testing.  39 (2023)  4 - p. 409-420 , 2023
Link: https://doi.org/10.1007/..
 
?
3

Evaluating Soft Error Reliability of Combinational Circuits..:

, In: 2022 IEEE 23rd Latin American Test Symposium (LATS),
Farias, Clayton R. ; Schvittz, Rafael B. ; Balen, Tiago R.. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
?
4

Fault Tolerance Evaluation of Different Majority Voter Desi..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Oliveira, Ingrid F. V. ; Pontes, Matheus F. ; Schvittz, Rafael B.... - p. 185-189 , 2022
Link: https://doi.org/10.1109/..
 
?
5

The Impact of Logic Gates Susceptibility in Overall Circuit..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Pontes, Matheus F. ; Oliveira, Ingrid F. V. ; Schvittz, Rafael B... - p. 1610-1614 , 2022
Link: https://doi.org/10.1109/..
 
?
6

Improving Soft Error Robustness of Full Adder Circuits with..:

, In: 2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI),
Oliveira, Rafael N. M. ; da Silva, Fabio G. R. G. ; Reis, Ricardo.. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
?
7

Methods for Susceptibility Analysis of Logic Gates in the P..:

, In: 2020 IEEE International Test Conference (ITC),
Schvittz, Rafael B. ; Butzen, Paulo F. ; Rosa, Leomar S. da - p. 1-9 , 2020
Link: https://doi.org/10.1109/..
 
?
8

An Improved Technique for Logic Gate Susceptibility Evaluat..:

, In: IFIP Advances in Information and Communication Technology; VLSI-SoC: New Technology Enabler,
Schvittz, Rafael B. ; Franco, Denis T. ; da Rosa Jr., Leomar S.. - p. 69-88 , 2020
Link: https://doi.org/10.1007/..
 
?
9

Comparing analytical and Monte-Carlo-based simulation metho..:

Schvittz, R.B. ; Aguiar, Y.Q. ; Wrobel, F....
Microelectronics Reliability.  114 (2020)  - p. 113871 , 2020
Link: https://doi.org/10.1016/..
 
?
10

Single event transient sensitivity analysis of different 32..:

Oliveira, I.F.V. ; Schvittz, R.B. ; Butzen, P.F.
Microelectronics Reliability.  100-101 (2019)  - p. 113369 , 2019
Link: https://doi.org/10.1016/..
 
?
11

Reliability evaluation of circuits designed in multi- and s..:

, In: 2018 IEEE 9th Latin American Symposium on Circuits & Systems (LASCAS),
Schvittz, R. B. ; Pontes, M. ; Meinhardt, C.... - p. 1-4 , 2018
Link: https://doi.org/10.1109/..
 
?
12

Survey on Reliability Estimation in Digital Circuits:

Ferreira Pontes, Matheus ; Farias, Clayton ; Schvittz, Rafael..
Journal of Integrated Circuits and Systems.  16 (2021)  3 - p. 1-11 , 2021
Link: https://doi.org/10.29292..
 
?
13

Exploring Logic Gates Layout to Improve the Accuracy of Cir..:

, In: 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC),
Schvittz, Rafael ; Soares, Leomar ; Butzen, Paulo Francisco - p. 234-235 , 2019
Link: https://doi.org/10.1109/..
 
?
14

A Simplified Layout-Level method for Single Event Transient..:

, In: 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC),
Schvittz, Rafael ; Franco, Denis Teixeira ; Soares, Leomar. - p. 185-190 , 2019
Link: https://doi.org/10.1109/..
 
1-14