Seidel, Peter
1987  results:
Search for persons X
?
3

Influence of power cycling ageing on the current and voltag..:

Deng, Erping ; Liu, Xing ; Seidel, Peter..
Microelectronics Reliability.  122 (2021)  - p. 114161 , 2021
 
?
 
?
6

Specific aspects regarding evaluation of power cycling test..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
 
?
13

Power cycling capability of silicon low-voltage MOSFETs und..:

, In: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Schwabe, Christian ; Seidel, Peter ; Lutz, Josef - p. 495-498 , 2019
 
?
14

Simulation of current crowding in inverse diodes of low-vol..:

, In: 2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe),
Schwabe, Christian ; Seidel, Peter ; Lutz, Josef - p. P.1-P.7 , 2019
 
1-15