E-LIB Suche - Ergebnisse für: Seybou, T. Garba

1

Device Reliability to Circuit Qualification: Insights and C..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),

Cacho, F. ; Bravaix, A. ; Seybou, T. Garba... - p. 1-7 , 2022

Link: https://doi.org/10.1109/..

2

CMOS Scaling Challenges for High Performance and Low Power ..:

Bravaix, A ; Hamparsoumian, G ; Sonzogni, J...
Journal of Physics: Conference Series. 2548 (2023) 1 - p. 012003 , 2023

Link: https://doi.org/10.1088/..

3

Integrated Test Circuit for Off-State Dynamic Drain Stress ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Hai, J. ; Cacho, F. ; Federspiel, X.... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

4

Modeling hot carrier damage interaction between on and off ..:

Garba-Seybou, T. ; Bravaix, A. ; Federspiel, X..
Microelectronics Reliability. 126 (2021) - p. 114342 , 2021

Link: https://doi.org/10.1016/..

5

Device Reliability to Circuit Qualification: Insights and C..:

Cacho, F ; Bravaix, Alain ; Seybou, T. Garba...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IIRW56459.2022.10077885. , 2022

Link: https://hal.science/hal-..

6

Device Reliability to Circuit Qualification: Insights and C..:

Cacho, F ; Bravaix, Alain ; Seybou, T. Garba...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IIRW56459.2022.10077885. , 2022

Link: https://hal.science/hal-..

7

Device Reliability to Circuit Qualification: Insights and C..:

Cacho, F ; Bravaix, Alain ; Seybou, T. Garba...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IIRW56459.2022.10077885. , 2022

Link: https://hal.science/hal-..

8

Livestock feed markets across seasons in periurban areas of..:

Ayantunde, Augustine A. ; Adamou, Kalilou ; Seybou, Garba.
Revue d'élevage et de médecine vétérinaire des pays tropicaux. 75 (2022) 2 - p. 47-54 , 2022

Link: https://doi.org/10.19182..

9

Altered Fatty Acid Profile of Polar Lipids in Maize Seedlin..:

Chaffai, R. ; Elhammadi, M. A. ; Seybou, T. N....
Journal of Agronomy and Crop Science. 193 (2007) 3 - p. 207-217 , 2007

Link: https://doi.org/10.1111/..

10

Universal Dielectric Breakdown Modeling Under Off-State TDD..:

Garba-Seybou, Tidjani ; Bravaix, Alain ; Federspiel, Xavier...
IEEE Transactions on Device and Materials Reliability. 24 (2024) 2 - p. 174-183 , 2024

Link: https://doi.org/10.1109/..

11

Location of Oxide Breakdown Events under Off-state TDDB in ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Garba-Seybou, Tidjani ; Federspiel, Xavier ; Monsieur, Frederic... - p. 1-8 , 2023

Link: https://doi.org/10.1109/..

12

Current Driven Modeling and SILC Investigation of Oxide Bre..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Garba-Seybou, Tidjani ; Bravaix, Alain ; Federspiel, Xavier... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

13

Optimisation de l'Evaluation de la Biomasse Fourragère en Z..:

Garba, Issa ; Abdourahamane, Zakari Seybou ; Sanoussi, Abdou Amadou.
European Scientific Journal, ESJ. 19 (2023) 33 - p. 52 , 2023

Link: https://doi.org/10.19044..

14

A Drought Dataset Based on a Composite Index for the Saheli..:

Garba, Issa ; Abdourahamane, Zakari Seybou ; Mirzabaev, Alisher
Data. 8 (2023) 2 - p. 28 , 2023

Link: https://doi.org/10.3390/..

15

Proactive policy options for drought resilience in the Sahe..:

Boukary, Aboubakr Gambo ; Garba, Issa ; Abdourahamane, Zakari Seybou.
Journal of Arid Environments. 218 (2023) - p. 105054 , 2023

Link: https://doi.org/10.1016/..