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Shang, Fukuan
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A YOLOv5-Based Method for Detecting Insulator Defects in Tr..:

, In: 2023 2nd International Conference on Artificial Intelligence and Intelligent Information Processing (AIIIP),
Shang, Fukuan ; Pan, Zhongliang - p. 324-327 , 2023
Link: https://doi.org/10.1109/..
 
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