E-LIB Suche - Ergebnisse für: Sheng SR (Sheng Shuran)

1

XPS depth profiling study of n/TCO interfaces for p-i-n amo..:

Sheng SR (Sheng Shuran) ; Hao HY (Hao Huiying) ; Diao HW (Diao Hongwei)...
APPLIED SURFACE SCIENCE. , 2006

Link: http://ir.semi.ac.cn/han..

2

Joint Resource Allocation and Reflecting Precoding Design f..:

Li, Xiaohui ; Wang, Hong ; Chen, Yunpei.
IEEE Wireless Communications Letters. 13 (2024) 4 - p. 1193-1197 , 2024

Link: https://doi.org/10.1109/..

3

R-SACE: RIS-Enabled Sensing-Aided Communication Enhancement..:

, In: 2023 IEEE 22nd International Conference on Trust, Security and Privacy in Computing and Communications (TrustCom),

Li, Xiaohui ; Chen, Yunpei ; Wang, Hong. - p. 2714-2719 , 2023

Link: https://doi.org/10.1109/..

4

The Low Cost DOA estimation Method for LSS-Target via Intel..:

, In: 2021 CIE International Conference on Radar (Radar),

Chen, Zhimin ; Chen, Peng ; Sheng, Shuran - p. 2248-2253 , 2021

Link: https://doi.org/10.1109/..

5

Deep Reinforcement Learning-Based Task Scheduling in IoT Ed..:

Sheng, Shuran ; Chen, Peng ; Chen, Zhimin..
Sensors. 21 (2021) 5 - p. 1666 , 2021

Link: https://doi.org/10.3390/..

6

Atomic Network-Based DOA Estimation Using Low-Bit ADC:

Sheng, Shuran ; Chen, Peng ; Yao, Yuxuan..
Electronics. 10 (2021) 6 - p. 738 , 2021

Link: https://doi.org/10.3390/..

7

Edge Caching for IoT Transient Data Using Deep Reinforcemen..:

, In: IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society,

Sheng, Shuran ; Chen, Peng ; Chen, Zhimin.. - p. 4477-4482 , 2020

Link: https://doi.org/10.1109/..

8

XPS depth profiling study of n/TCO interfaces for p-i-n amo..:

Sheng, Shuran ; Hao, Huiying ; Diao, Hongwei...
Applied Surface Science. 253 (2006) 3 - p. 1677-1682 , 2006

Link: https://doi.org/10.1016/..

9

Acid Stability and Oxygen Reduction Activity of Magnetron-S..:

Bonakdarpour, Arman ; Lobel, Robert ; Dahn, Jeff R...
ECS Transactions. 3 (2006) 1 - p. 151-159 , 2006

Link: https://doi.org/10.1149/..

10

Structural characterization of stable amorphous silicon fil..:

Zhang, Shibin ; Kong, Guanglin ; Wang, Yongqian..
Solid State Communications. 122 (2002) 5 - p. 283-286 , 2002

Link: https://doi.org/10.1016/..

11

Structural changes in amorphous silicon studied by X-ray ph..:

Sheng, Shuran ; Sacher, Edward ; Yelon, Arthur
Journal of Non-Crystalline Solids. 282 (2001) 2-3 - p. 165-172 , 2001

Link: https://doi.org/10.1016/..

12

Gap states of hydrogenated amorphous silicon near and above..:

Sheng, Shuran ; Liao, Xianbo ; Kong, Guanglin
Applied Physics Letters. 78 (2001) 17 - p. 2509-2511 , 2001

Link: https://doi.org/10.1063/..

13

Light and annealing induced changes in Si–H bonds in undope..:

Sheng, Shuran ; Kong, Guanglin ; Liao, Xainbo
Solid State Communications. 116 (2000) 9 - p. 519-524 , 2000

Link: https://doi.org/10.1016/..

14

Study of microstructure of high stability hydrogenated amor..:

Sheng, Shuran ; Liao, Xianbo ; Kong, Guanglin.
Applied Physics Letters. 73 (1998) 3 - p. 336-338 , 1998

Link: https://doi.org/10.1063/..

15

Polycrystalline silicon thin films and solar cells prepared..:

Zhao, Yuwen ; Li, Zhongming ; He, Saoqi...
Solar Energy Materials and Solar Cells. 48 (1997) 1-4 - p. 321-326 , 1997

Link: https://doi.org/10.1016/..