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Shih, Jiaw-Ren
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1

Advanced self-convergent calibration for selenized two-dime..:

Liu, Che-Chuan ; Shen, Hsin-Yi ; Wang, Kuangye...
Japanese Journal of Applied Physics.  63 (2024)  2 - p. 02SP34 , 2024
Link: https://doi.org/10.35848..
 
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2

Complementary Detectors for DUV Sensing by CMOS Logic Techn..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Huang, Ting-Kai ; Yeh, Hsin-Hung ; Shih, Jiaw-Ren.. - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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3

4K Detectors Array for On-Wafer EUV Imaging in Lithography ..:

Chang, Wei ; Wang, Chien-Ping ; Huang, Yao-Hung...
IEEE Transactions on Electron Devices.  70 (2023)  11 - p. 5713-5719 , 2023
Link: https://doi.org/10.1109/..
 
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4

16nm FinFET DUV Detector Array in Fully Compatible FinFET L..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Lin, Wei-Hwa ; Shih, Jiaw-Ren ; Chang, Jonathan... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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5

Multilevel Fully Logic-Compatible Latch Array for Computing..:

Yeh, Ming-Shyue ; Wang, Ya-Ching ; Huang, Yao-Hung...
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 2001-2008 , 2023
Link: https://doi.org/10.1109/..
 
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6

A New Self-Powered Wireless Sensing Circuitry for On-Wafer ..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lin, Wei-Hwa ; Chen, Li Ci ; Ho, Ming-Han... - p. 31.5.1-31.5.4 , 2022
Link: https://doi.org/10.1109/..
 
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7

2T-Pixel Sensors Array for on-Wafer in-Chamber DUV Sensing:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Lin, Wei-Hwa ; Wang, Chien-Ping ; Shih, Jiaw-Ren.. - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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8

An Investigation of Plasma Charging Effect on FinFET Front-..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Yang, Kai-Wei ; Chao, Yi-Jie ; Shih, Jiaw-Ren.. - p. 384-386 , 2022
Link: https://doi.org/10.1109/..
 
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9

Embedded Micro-detectors for EUV Exposure Control in FinFET..:

Wang, Chien-Ping ; Lin, Burn Jeng ; Wu, Pin-Jiun...
Nanoscale Research Letters.  17 (2022)  1 - p. , 2022
Link: https://doi.org/10.1186/..
 
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10

On-Wafer Electronic Layer Detectors Array (ELDA) for e-beam..:

, In: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Wang, Chien-Ping ; Lin, Bum Jeng ; Shih, Jiaw-Ren... - p. 1-2 , 2021
Link: https://doi.org/10.1109/..
 
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11

An Early Detection Circuit for Endurance Enhancement of Bac..:

Kao, Yun-Feng ; Shih, Jiaw-Ren ; Lin, Chrong Jung.
Nanoscale Research Letters.  16 (2021)  1 - p. , 2021
Link: https://doi.org/10.1186/..
 
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12

Detectors Array for In Situ Electron Beam Imaging by 16-nm ..:

Wang, Chien-Ping ; Lin, Burn Jeng ; Shih, Jiaw-Ren...
Nanoscale Research Letters.  16 (2021)  1 - p. , 2021
Link: https://doi.org/10.1186/..
 
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13

Hair-Like Nanostructure Based Ion Detector by 16nm FinFET T..:

, In: 2020 IEEE Symposium on VLSI Technology,
Wang, Chien-Ping ; Shen, Ying-Chun ; Liou, Kun-Lin... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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14

Analytical Model of Human Body Model Electrostatic Discharg..:

Shih, Jiaw-Ren ; Lee, Jian-Hsing ; Hwang, Huey-Liang..
Japanese Journal of Applied Physics.  38 (1999)  8R - p. 4632 , 1999
Link: https://doi.org/10.1143/..
 
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15

The Method to Optimize Gate Oxide Integrity, Hot Carrier Ef..:

Shih, Jiaw-Ren ; Lee, Jian-Hsing ; Chen, Shui-Hung...
Japanese Journal of Applied Physics.  38 (1999)  11B - p. L1287 , 1999
Link: https://doi.org/10.1143/..
 
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