E-LIB Suche - Ergebnisse für: Shluger, Alexander, L

1

Simulation of mechanical effects of hydrogen in bicrystalli..:

Fotopoulos, Vasileios ; Shluger, Alexander
Procedia Structural Integrity. 52 (2024) - p. 356-365 , 2024

Link: https://doi.org/10.1016/..

2

Dielectric breakdown of oxide films in electronic devices:

Padovani, Andrea ; La Torraca, Paolo ; Strand, Jack..
Nature Reviews Materials. , 2024

Link: https://doi.org/10.1038/..

3

First Principles Study on the Segregation of Metallic Solut..:

, In: The Minerals, Metals & Materials Series; TMS 2024 153rd Annual Meeting & Exhibition Supplemental Proceedings,

Fotopoulos, Vasileios ; Strand, Jack ; Petersmann, Manuel. - p. 989-999 , 2024

Link: https://doi.org/10.1007/..

4

Modeling the Effects of Varying the Ti Concentration on the..:

Fotopoulos, Vasileios ; O'Hern, Corey S. ; Shattuck, Mark D..
ACS Omega. 9 (2024) 9 - p. 10286-10298 , 2024

Link: https://doi.org/10.1021/..

5

Electron emission from deep traps in HfO2 under thermal and..:

Izmailov, Roman ; Strand, Jack ; Ronchi, Nicolo'..
Physical Review B. 109 (2024) 13 - p. , 2024

Link: https://doi.org/10.1103/..

6

Molecular Dynamics Simulations of the Thermal Evolution of ..:

, In: The Minerals, Metals & Materials Series; TMS 2023 152nd Annual Meeting & Exhibition Supplemental Proceedings,

Fotopoulos, Vasileios ; O'Hern, Corey S. ; Shluger, Alexander L. - p. 1001-1010 , 2023

Link: https://doi.org/10.1007/..

7

Thermodynamic analysis of the interaction between metal vac..:

Fotopoulos, Vasileios ; Grau-Crespo, Ricardo ; Shluger, Alexander L.
Physical Chemistry Chemical Physics. 25 (2023) 13 - p. 9168-9175 , 2023

Link: https://doi.org/10.1039/..

8

Difference in Structure and Electronic Properties of Oxygen..:

Milton, Katherine L. ; Durrant, Thomas R. ; Cobos Freire, Teofilo.
Materials. 16 (2023) 4 - p. 1382 , 2023

Link: https://doi.org/10.3390/..

9

P-Type Impurities in 4H-SiC Calculated Using Density Functi..:

Smith, Niamh ; Weger, Magdalena ; Pobegen, Gregor.
Defect and Diffusion Forum. 426 (2023) - p. 35-42 , 2023

Link: https://doi.org/10.4028/..

10

Modeling Degradation and Breakdown in SiO2 and High-k Gate ..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),

Padovani, Andrea ; Torraca, Paolo La ; Larcher, Luca.. - p. 93-96 , 2023

Link: https://doi.org/10.23919..

11

Defects in WS2 monolayer calculated with a nonlocal functio..:

Kieczka, Daria ; Durrant, Thomas ; Milton, Katherine...
Electronic Structure. 5 (2023) 2 - p. 024001 , 2023

Link: https://doi.org/10.1088/..

12

Towards a Universal Model of Dielectric Breakdown:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Padovani, Andrea ; Torraca, Paolo La ; Strand, Jack... - p. 1-8 , 2023

Link: https://doi.org/10.1109/..

13

On the Structure of Oxygen Deficient Amorphous Oxide Films:

Strand, Jack ; Shluger, Alexander L.
Advanced Science. 11 (2023) 8 - p. , 2023

Link: https://doi.org/10.1002/..

14

Structure and Migration Mechanisms of Small Vacancy Cluster..:

Fotopoulos, Vasileios ; Mora-Fonz, David ; Kleinbichler, Manuel...
Nanomaterials. 13 (2023) 9 - p. 1464 , 2023

Link: https://doi.org/10.3390/..

15

Unique Atomic and Electronic Structures of Oxygen Vacancies..:

Kiyohara, Shin ; Mora-Fonz, David ; Shluger, Alexander..
The Journal of Physical Chemistry C. 126 (2022) 44 - p. 18833-18838 , 2022

Link: https://doi.org/10.1021/..