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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
12
Robust Growth of Electronic Grade p-type Large Area 2D WSe2..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
13
Decoupling Current and Voltage Mediated Breakdown Mechanism..:
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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
14
Probing the Origin of Photocurrent in 2D Bilayer MoSe₂-WSe₂..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
15